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Nanoscale EELS and EDX Analyses of GaN Nanowires and GaN/AlGaN Radial Heterostructure Nanowires

Published online by Cambridge University Press:  03 August 2008

L Lari ,
RT Murray ,
MH Gass ,
T Bullough ,
PR Chalker ,
C Chèze ,
L Geelhaar  and
H Riechert
L Lari
Affiliation:
University of Liverpool, United Kingdom
RT Murray
Affiliation:
University of Liverpool, United Kingdom
MH Gass
Affiliation:
SuperSTEM Laboratory, United Kingdom
T Bullough
Affiliation:
University of Liverpool, United Kingdom
PR Chalker
Affiliation:
University of Liverpool, United Kingdom
C Chèze
Affiliation:
Paul-Drude-Institut für Festkörperelektronik, Germany
L Geelhaar
Affiliation:
NaMLab GmbH, Germany
H Riechert
Affiliation:
Paul-Drude-Institut für Festkörperelektronik, Germany
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1394 - 1395
Copyright
© 2008 Microscopy Society of America

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