Hostname: page-component-76fb5796d-22dnz Total loading time: 0 Render date: 2024-04-25T07:37:37.112Z Has data issue: false hasContentIssue false
  • English
  • Français

Need for Large-Area EDS Detectors for Imaging Nanoparticles in a SEM Operating in Transmission Mode

Published online by Cambridge University Press:  27 August 2014

Steffi Rades ,
Tobias Salge ,
Roland Schmidt  and
Vasile-Dan Hodoroaba
Steffi Rades
Affiliation:
BAM Federal Institute for Materials Research and Testing, Division 6.8 Surface Analysis and Interfacial Chemistry, Berlin, Germany.
Tobias Salge
Affiliation:
Bruker Nano GmbH, Berlin, Germany.
Roland Schmidt
Affiliation:
Hitachi High-Technologies Europe GmbH, Krefeld, Germany.
Vasile-Dan Hodoroaba
Affiliation:
BAM Federal Institute for Materials Research and Testing, Division 6.8 Surface Analysis and Interfacial Chemistry, Berlin, Germany.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 662 - 663
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Buhr, E, Senftleben, N, et al., Meas. Sci. Technol. 20 (2009), p. 413.Google Scholar
[2] Hodoroaba, V-D, Benemann, S, et al., Microsc. Microanal. 18 (Suppl 2) (2012), p. 1750.Google Scholar
[3] Motzkus, C, Macé, T, et al., J. Nanopart. Res. 152013), p. 1919.Google Scholar
[4] Hodoroaba, V-D, Akcakayiran, D, et al., Analyst (2014), in press.Google Scholar
[5] Hodoroaba, V-D, Rades, S, et al., Surf. Interf. Anal (2014), in press.Google Scholar
[6] The research leading to these results has received funding from the European Union’s Seventh Framework Programme (FP7/2007-2013) under grant agreement n° 263147 (NanoValid - Development of reference methods for hazard identification, risk assessment and LCA of engineered nanomaterials).Google Scholar