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New Methods in Materials Characterisation with Energy and Spatially Resolving X-ray Detectors

Published online by Cambridge University Press:  10 August 2018

Henry J Kirkwood ,
Martin J de Jonge  and
Brian Abbey
Henry J Kirkwood*
Affiliation:
European XFEL GmbH, Schenefeld, 22869, Germany
Martin J de Jonge
Affiliation:
Australian Synchrotron, Clayton, Victoria, 3168, Australia
Brian Abbey
Affiliation:
Australian Research Council Centre of Excellence in Advanced Molecular Imaging, Department of Chemistry and Physics, La Trobe Institute for Molecular Science, La Trobe University, Victoria3086, Australia
*
* Corresponding author, henry.kirkwood@xfel.eu

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 92 - 93
Copyright
© Microscopy Society of America 2018 

References

[1] Kirkham, R, et al In AIP Conf. Proc. 1234(1), 240–243.Google Scholar
[2] Paterson, , et al In AIP Conf. Proc. 1365(1), 219–222.Google Scholar
[3] Kirkwood, , et al, Acta Materialia 144 2018 1–10.CrossRefGoogle Scholar
[4] Kirkwood, , et al, Powder Diffraction 9 2017 1–6.Google Scholar