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New Opportunities with Oval-shaped Silicon Drift Detectors for High-Throughput EDX Analysis in Electron Microscopy

Published online by Cambridge University Press:  25 July 2016

A. Niculae ,
A. Bechteler ,
R. Eckhardt ,
K. Hermenau ,
A. Liebel ,
G. Lutz ,
A. Schöning ,
H. Soltau  and
L. Strüder
A. Niculae
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 7, München, Germany
A. Bechteler
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 7, München, Germany
R. Eckhardt
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 7, München, Germany
K. Hermenau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 7, München, Germany
A. Liebel
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 7, München, Germany
G. Lutz
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 7, München, Germany
A. Schöning
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 7, München, Germany
H. Soltau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 7, München, Germany
L. Strüder
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 7, München, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 42 - 43
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Liebel, A., et al., paper presented at M&M 2013 in Indianapolis.Google Scholar
[2] Niculae, A., et al., paper presented at M&M 2013 in Indianapolis.Google Scholar