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Microscopy and Microanalysis Microscopy and Microanalysis

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Noise Removal by Crystallographic Averaging and Information Content of an Image With Respect to Detections of Plane Symmetries

Published online by Cambridge University Press:  25 July 2016

Peter Moeck ,
Andrew Dempsey  and
Jack C. Straton
Peter Moeck
Affiliation:
Nano-Crystallography Group, Department of Physics, Portland State University, Portland, OR, USA
Andrew Dempsey
Affiliation:
Nano-Crystallography Group, Department of Physics, Portland State University, Portland, OR, USA
Jack C. Straton
Affiliation:
Nano-Crystallography Group, Department of Physics, Portland State University, Portland, OR, USA

Abstract

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Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 562 - 563
Copyright
© Microscopy Society of America 2016 

References

[1] Zou, X., Hovmöller, S. & Oleynikov, P. Electron Crystallography: Electron Microscopy and Electron Diffraction, IUCr Texts on Crystallography 16 , (Oxford University Press (2011).CrossRefGoogle Scholar
[2] Neiner, D., et al., J. Am. Chem. Soc 129 (2007) 13857–13862.CrossRefGoogle Scholar
[3] Moeck, P. in: Microscopy: Science Technology, Applications and Education 3 (2010) 1951–1962.Google Scholar
[4] Moeck, P., et al., Proc. 11th IEEE Intern. Conf. Nanotech (2011) 891–896. doi:10.1109/NANO.2011.6144508.Google Scholar
[5] Straton, J. C., et al., Cryst. Res. Technol. 49 (2014) 663-680; Adv. Struct. Chem. Imaging 1 (2015) 14.Google Scholar
[6] Park, S. & Quate, C. F. J. Appl. Phys 62 (1987) 312–314.CrossRefGoogle Scholar
[7] Mazur, U., et al., J. Phys. Chem. B 108 (2004) 17003–17006.CrossRefGoogle Scholar
[8] Kanatani, K. Intern. J. Comp. Vision 26 (1998) 171–189.CrossRefGoogle Scholar
[9] The first author acknowledges funding from Portland State University's Faculty Enhancement program.Google Scholar
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