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Novel Applications of Zeiss Libra 200 Cs-Corrected TEM with Energy Filtered Precession Electron Diffraction for Structure Determination of Nanocrystals

Published online by Cambridge University Press:  01 August 2010

S Nicolopoulos ,
D Bultreys ,
G Pavia ,
G Benner ,
H Niebel ,
M Gemmi  and
B Janssens
S Nicolopoulos
Affiliation:
NanoMEGAS SPRL, Belgium
D Bultreys
Affiliation:
NanoMEGAS SPRL, Belgium
G Pavia
Affiliation:
Carl Zeiss NTS, Germany
G Benner
Affiliation:
Carl Zeiss NTS, Germany
H Niebel
Affiliation:
Carl Zeiss NTS, Germany
M Gemmi
Affiliation:
Università degli Studi di Milano, Italy
B Janssens
Affiliation:
NanoMEGAS USA

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 26 - 27
Copyright
Copyright © Microscopy Society of America 2010