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Opportunities and Challenges in Ultra-High Energy Resolution EELS

Published online by Cambridge University Press:  25 July 2016

Ondrej L. Krivanek ,
N. Dellby ,
M.V. Hoffman  and
T.C. Lovejoy
Ondrej L. Krivanek
Affiliation:
Nion Co., 11511 NE 118th St., Kirkland, WA98034, USA
N. Dellby
Affiliation:
Nion Co., 11511 NE 118th St., Kirkland, WA98034, USA
M.V. Hoffman
Affiliation:
Nion Co., 11511 NE 118th St., Kirkland, WA98034, USA
T.C. Lovejoy
Affiliation:
Nion Co., 11511 NE 118th St., Kirkland, WA98034, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 952 - 953
Copyright
© Microscopy Society of America 2016 

References

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[5] Lovejoy, T.C., et al., Microsc. Microanal. 20(Suppl 3 (2014) 558.Google Scholar
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