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Opportunities in Angularly Resolved Dark-field STEM using Pixelated Detectors

Published online by Cambridge University Press:  23 September 2015

Lewys Jones
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Hao Yang
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Katherine E. MacArthur
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Henning Ryll
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Martin Simson
Affiliation:
PNDetector GmbH, SckellstraBe 3, 81667 Munchen, Germany
Heike Soltau
Affiliation:
PNDetector GmbH, SckellstraBe 3, 81667 Munchen, Germany
Yukihito Kondo
Affiliation:
JEOL Ltd.,3-1-2 Musashino Akishima Tokyo 196-8558 Japan
Ryusuke Sagawa
Affiliation:
JEOL Ltd.,3-1-2 Musashino Akishima Tokyo 196-8558 Japan
Hiroyuki Banba
Affiliation:
JEOL Ltd.,3-1-2 Musashino Akishima Tokyo 196-8558 Japan
Peter D. Nellist
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
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Abstract

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Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Pennycook, T. J., et al, Ultramicroscopy in-press 2014.Google Scholar
[2] Hillyard, S. & Silcox, J., Ultramicroscopy 58 (1995). p. 617.CrossRefGoogle Scholar
[3] Zhu, G., et al., Appl. Phys. Lett. 105 (2014). p. 231607.CrossRefGoogle Scholar
[4] Lebeau, J. M. & Stemmer, S., Ultramicroscopy 108 (2008). p. 16531658.CrossRefGoogle Scholar
[5] This work was supported by the EU grant 312483 - ESTEEM2 and EPSRC grant EP/K040375/. 1. The authors thank Johnson Matthey for the PtCo sample and for financially supporting KEM.Google Scholar
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