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Optimized Damage-Reduction 60 keV Monochromated Electron Energy-Loss Spectroscopy Measurements of Optical Properties at the Donor/Acceptor Interface in Organic Photovoltaic Devices

Published online by Cambridge University Press:  25 July 2016

Jessica A. Alexander ,
Frank J. Scheltens ,
Lawrence F. Drummy ,
Michael F. Durstock ,
James B. Gilchrist ,
Sandrine E.M. Heutz  and
David W. McComb
Jessica A. Alexander
Affiliation:
Center for Electron Microscopy and Analysis, Department of Materials Science and Engineering, The Ohio State University, College Road, Columbus OH 43210, United States
Frank J. Scheltens
Affiliation:
Center for Electron Microscopy and Analysis, Department of Materials Science and Engineering, The Ohio State University, College Road, Columbus OH 43210, United States
Lawrence F. Drummy
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, WPAFB, Ohio 45433, United States
Michael F. Durstock
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, WPAFB, Ohio 45433, United States
James B. Gilchrist
Affiliation:
Department of Materials, Imperial College London, SW7 2AZ, United Kingdom
Sandrine E.M. Heutz
Affiliation:
Department of Materials, Imperial College London, SW7 2AZ, United Kingdom
David W. McComb
Affiliation:
Center for Electron Microscopy and Analysis, Department of Materials Science and Engineering, The Ohio State University, College Road, Columbus OH 43210, United States

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 984 - 985
Copyright
© Microscopy Society of America 2016 

References

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[4] Chen, D., et al., Nano Lett 11 (2011) 561–567.Google Scholar
[5] Egerton, R.F. in Electron Energy-Loss Spectroscopy in the Electron Microscope, Third Edition , (Springer, New York).Google Scholar
[6] Tompkins, H.G. & Irene, E.A. in Handbook of Ellipsometry. Springer (2005).Google Scholar
[7] The authors acknowledge the Air Force Office of Scientific Research and the Air Force Research Laboratory (AFRL) Materials and Manufacturing Directorate, the Dayton Area Graduate Studies Institute (DAGSI), and The Ohio State University for funding; Kurt Eynik and Luke Bissel from AFRL for technical support; and The Ohio State University Center for Electron Microscopy and Analysis for technical support.Google Scholar