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Oxygen Vacancy Ordering: a Degree of Freedom that can Control the Structural, Electronic and Magnetic Properties of Transition-Metal Oxide Films

Published online by Cambridge University Press:  27 August 2014

M. Varela ,
J. Salafranca ,
N. Biskup ,
J. Gazquez ,
M. P. Oxley ,
V. Mehta ,
Y. Suzuki ,
S. Bose ,
M. Sharma  and
C. Leighton
...Show all authors
M. Varela
Affiliation:
Materials Science & Technology Div., Oak Ridge National Laboratory, Oak Ridge TN 37831, U.S.A. Dept. de Física Aplicada III & Instituto Pluridisciplinar, Univ. Complutense, Madrid, 28040Spain
J. Salafranca
Affiliation:
Materials Science & Technology Div., Oak Ridge National Laboratory, Oak Ridge TN 37831, U.S.A. Dept. de Física Aplicada III & Instituto Pluridisciplinar, Univ. Complutense, Madrid, 28040Spain
N. Biskup
Affiliation:
Dept. de Física Aplicada III & Instituto Pluridisciplinar, Univ. Complutense, Madrid, 28040Spain
J. Gazquez
Affiliation:
Instituto de Ciencia de Materiales de Barcelona, ICMAB-CSIC, Bellaterra, 08193Spain
M. P. Oxley
Affiliation:
Materials Science & Technology Div., Oak Ridge National Laboratory, Oak Ridge TN 37831, U.S.A. Dept. of Physics & Astronomy, Vanderbilt University. Nashville, TN 37235, U.S.A.
V. Mehta
Affiliation:
Dept. of Material Science and Engineering, University of California, Berkeley, CA 94720, U.S.A.
Y. Suzuki
Affiliation:
Dept. of Material Science and Engineering, University of California, Berkeley, CA 94720, U.S.A. Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, U.S.A. Dept. of Applied Physics and Geballe Laboratory for Advanced Materials, Stanford University,Stanford, CA 94305, U.S.A.
S. Bose
Affiliation:
Dept. of Chemical Eng. and Materials Science, Univ. of Minnesota, Minneapolis, MN 55455, U.S.A
M. Sharma
Affiliation:
Dept. of Chemical Eng. and Materials Science, Univ. of Minnesota, Minneapolis, MN 55455, U.S.A
C. Leighton
Affiliation:
Dept. of Chemical Eng. and Materials Science, Univ. of Minnesota, Minneapolis, MN 55455, U.S.A
W. Luo
Affiliation:
Materials Science & Technology Div., Oak Ridge National Laboratory, Oak Ridge TN 37831, U.S.A. Dept. of Physics & Astronomy, Vanderbilt University. Nashville, TN 37235, U.S.A.
S. T. Pantelides
Affiliation:
Materials Science & Technology Div., Oak Ridge National Laboratory, Oak Ridge TN 37831, U.S.A. Dept. of Physics & Astronomy, Vanderbilt University. Nashville, TN 37235, U.S.A. Dept. of Electrical Eng. and Computer Science, Vanderbilt University, Nashville, TN 37235, U.S.A.
S. J. Pennycook
Affiliation:
Dept. of Materials Science & Engineering, University of Tennessee, Knoxville TN 37996, U.S.A.

Abstract

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Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 556 - 557
Copyright
Copyright © Microscopy Society of America 2014 

References

Salafranca, J., et al., Nanoletters 12 (2012), 2499.Google Scholar
Fuchs, D., et al., Physical Review B 75 (2007), 144402.Google Scholar
Mehta, V. V., et al., J. Appl. Phys. 105 (2009), 07E503.Google Scholar
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Senaris-Rodriguez, M. A., Goodenough, J. B. Journal of Solid State Chemistry 116 (1995), 224.Google Scholar
Biskup, N., et al., Physical Review Letters (2014), in press.Google Scholar
Gazquez, J., et al., Nanoletters 11 (2011), 973.Google Scholar
Gazquez, J., et al., Applied Physics Letters Materials 1 (2013), 012105.Google Scholar
The authors thank Masashi Watanabe for the Digital Micrograph PCA plug-in. Research at ORNL was supported by the U.S. Department of Energy (DOE), Basic Energy Sciences (BES), Materials Sciences and Engineering Division, and through a user project supported by ORNL’s Center for Nanophase Materials CNMS) User Program, which is also sponsored by DOE-BES. Research at UCM was supported by the ERC starting Investigator Award, grant #239739 STEMOX and the Juan de la Cierva program. Research at UC Berkeley/LBNL and Stanford was supported by the Director, Office of Science, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering under Contract Numbers DE-AC02-05CH11231 and DE-SC0008505 respectively. Research at Vanderbilt was supported in part by the U.S DOE grant DE-FG02-09ER46554 and the McMinn Endowment.Computations were supported by the National Center for Supercomputing Applications (U.S. Department of Energy, contract no. DE-AC02-05CH11231). JG acknowledges support from the Spanish MEC 2007-0086. Work at UMN supported by NSF (DMR-0804432) and DOE (DE-FG02-06ER46275, specifically scattering characterization).Google Scholar