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Phase and Atomic Displacement Profiles within Crystals Measured and Simulated using the Self-interference of Split HOLZ Lines

Published online by Cambridge University Press:  04 August 2017

Mana Norouzpour
Affiliation:
CAMTEC, Mechanical Engineering, University of Victoria, Victoria, Canada V8W 2Y2
Rodney Herring
Affiliation:
CAMTEC, Mechanical Engineering, University of Victoria, Victoria, Canada V8W 2Y2

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Norouzpour, M., et al, Journal of Materials Research 2017). p 113.Google Scholar
[2] Norouzpour, M., et al, M&M 2015). p 19651966.Google Scholar
[3] Herring, R., et al, Ultramicroscopy 156 2015). p 3740.CrossRefGoogle Scholar
[4] Alfonso, C., et al, Ultramicroscopy 110 2010). p 285296.CrossRefGoogle Scholar