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Practical Use of Scanning Low Energy Electron Microscope (SLEEM)

Published online by Cambridge University Press:  25 July 2016

Ilona Müllerová ,
Eliška Mikmeková ,
Šárka Mikmeková ,
Ivo Konvalina  and
Luděk Frank
Ilona Müllerová
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic.
Eliška Mikmeková
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic.
Šárka Mikmeková
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic.
Ivo Konvalina
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic.
Luděk Frank
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1650 - 1651
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Müllerova, I & Frank, L Advances in Imaging and Electron Physics 128 (2003). p. 309.CrossRefGoogle Scholar
[2] Matsuda, K, et al, Journal of Materials Science 41 (2006). p 2605.Google Scholar
[3] The authors acknowledge funding from the Technology Agency of the Czech Republic (Competence center Electron microscopy, no: TE01020118) and from the MEYS of the Czech Republic (LO1212) together with the European Commission (ALISI, no. CZ.1.05/2.1.00/01.0017).Google Scholar