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Pushing the Measuring Capabilities of Silicon Drift Detectors for EDX Imaging of Low-Z Materials Down to Lithium

Published online by Cambridge University Press:  05 August 2019

Adrian Niculae*
Affiliation:
PNDetector GmbH, München, Germany.
Thiago Barros
Affiliation:
PNDetector GmbH, München, Germany.
Alois Bechteler
Affiliation:
PNDetector GmbH, München, Germany.
Kathrin Hermenau
Affiliation:
PNDetector GmbH, München, Germany.
Klaus Heinzinger
Affiliation:
PNSensor GmbH, München, Germany.
Andreas Liebel
Affiliation:
PNDetector GmbH, München, Germany.
Heike Soltau
Affiliation:
PNDetector GmbH, München, Germany.
Lothar Strüder
Affiliation:
University of Siegen, Department of Physics, Siegen, Germany.
*
*Corresponding author: adrian.niculae@pndetector.de
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Abstract

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Type
Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope
Copyright
Copyright © Microscopy Society of America 2019 
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Pushing the Measuring Capabilities of Silicon Drift Detectors for EDX Imaging of Low-Z Materials Down to Lithium
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