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Quantification of Bonded Ni Atoms for M-M0S2 Metallic Contact through X-ray Photoemission Electron Microscopy

  • Xinying Shi (a1), Marko Huttula (a1), Vladimir Pankratov (a1), Joanna Hoszowska (a2), Jean-Claude Dousse (a2), Faisal Zeeshan (a2), Yuran Niu (a3), Alexei Zakharov (a3), Zhongjia Huang (a4), Gang Wang (a4), Sergei Posysaev (a1), Olga Miroshnichenko (a1), Matti Alatalo (a1) and Wei Cao (a1)...
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      Quantification of Bonded Ni Atoms for M-M0S2 Metallic Contact through X-ray Photoemission Electron Microscopy
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      Quantification of Bonded Ni Atoms for M-M0S2 Metallic Contact through X-ray Photoemission Electron Microscopy
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Abstract
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Corresponding author
*Corresponding author, xinying.shi@oulu.fi
References
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[1] Allain, A., et al, Nat. Mater. 14 2015) p. 1195.
[2] Kappera, R., et al, Nat. Mater. 13 2014) p. 1128.
[3] Leong, W. S., et al, ACS Nano 9 2015) p. 869.
[4] Shi, X., et al, Small 14 2018 1704526.
[5] Cao, W., et al, Mater. Chem. Phys. 158 2015) p. 89.
[6] Shi, X., et al, Crystals 8 2018 24.
[7] Kroll, T., et al, J. Chem. Phys. 137 2012 054306.
[8] The authors acknowledge funding from the European Commission's Seventh Framework Programme (FP7/2007-2013) CALIPSO (Grant No. 312284). X.S. thanks the scholarship sponsored by China Scholarship Council. J.H., J.-Cl.D. and F.Z. acknowledge the financial support of the Swiss National Science Foundation (Grant No. 200020_146739).
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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