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Quantification of Low Voltage Images of 2-dimensional Materials in Aberration Corrected Scanning Transmission Electron Microscopy.

Published online by Cambridge University Press:  04 August 2017

Mark P. Oxley ,
Nicholas G. Cross ,
Gerd Duscher ,
Leslie J. Allen  and
Matthew F. Chisholm
Mark P. Oxley
Affiliation:
Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge TN, USA.
Nicholas G. Cross
Affiliation:
University of Tennessee, Materials Science and Engineering, Knoxville TN, USA.
Gerd Duscher
Affiliation:
University of Tennessee, Materials Science and Engineering, Knoxville TN, USA.
Leslie J. Allen
Affiliation:
University of Melbourne, School of Physics, Parkville Victoria, Australia.
Matthew F. Chisholm
Affiliation:
Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge TN, USA.

Abstract

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Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 464 - 465
Copyright
© Microscopy Society of America 2017 

References

[1] LeBeau, J. M., et al, Physical Review Letters 100 2008 206101.CrossRefGoogle Scholar
[2] Krivanek, O. L., et al, Nature 462 2010). p. 1342.Google Scholar
[3] Zhou, W., et al, Microscopy and Microanalysis 18 2012). p. 342.Google Scholar
[4] Lowekamp, B. C., et al, Frontiers in Neuroinformatics 7 2013). p. 45.Google Scholar
[5] This research was supported by the US Department of Energy, Office of Basic Energy Sciences, Materials Sciences and Engineering Division. N.C. and G.D. acknowledge support from the National Science Foundation (NSF) under Grant No. DMR-1410940.Google Scholar