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Quantitative Atomic 3-D Imaging of Single/Double Sheet Graphene Structure by Exit-Wave Reconstruction Using a Titan G2 at 80kV Acceleration Voltage

Published online by Cambridge University Press:  01 August 2010

JR Jinschek ,
E Yucelen ,
HA Calderon  and
B Freitag
JR Jinschek
Affiliation:
FEI Company, The Netherlands
E Yucelen
Affiliation:
FEI Company, The Netherlands
HA Calderon
Affiliation:
Escuela Superior de Fisica Matematicas-Instituto Politecnico Nacional, Mexico
B Freitag
Affiliation:
FEI Company, The Netherlands

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1468 - 1469
Copyright
Copyright © Microscopy Society of America 2010