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Quantitative Measurements of the Penumbra of XEDS Systems in an AEM

  • Nestor J. Zaluzec (a1), Jianguo Wen (a1), Jie Wang (a1) and Dean J. Miller (a1)
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Abstract
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References
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[1] Zaluzec, N.J. “XEDS Tools: Solid Angle Calculator”, Website: <underline>http://tpm.amc.anl.gov/NJZTools/XEDSSolidAngle.html</underline>.
[2] Zaluzec, N.J., Roussie, J. & DesOrmeaux, J.P. (2016). 22, these proceedings.
[3] Zaluzec Microsc., N.J. Microanaly (2014) 20(4), 13181326.
[4] Research supported by U.S. DoE, Office of Science, Contract No. DE-AC02-06CH11357 at the Electron Microscopy Center, Center for Nanoscale Materials at Argonne National Laboratory.
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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