Hostname: page-component-8448b6f56d-xtgtn Total loading time: 0 Render date: 2024-04-23T15:19:08.042Z Has data issue: false hasContentIssue false
  • English
  • Français

Rapid High Resolution Combined AFM and Raman Microanalysis

Published online by Cambridge University Press:  01 August 2010

T Tague Jr  and
D Sampson
T Tague Jr
Affiliation:
Bruker Optics
D Sampson
Affiliation:
Bruker Optics

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 18 - 19
Copyright
Copyright © Microscopy Society of America 2010