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Real-Time Image Registration via A Deep Leaning Approach for Correlative X-ray and Electron Microscopy

Published online by Cambridge University Press:  30 July 2021

Yanqi Luo ,
Nestor Zaluzec ,
Mathew Cherukara ,
Xiaolan Wu  and
Si Chen
Yanqi Luo
Affiliation:
Argonne National Laboratory, United States
Nestor Zaluzec
Affiliation:
Argonne National Laboratory / Photon Science Directorate, Bolingbrook, Illinois, United States
Mathew Cherukara
Affiliation:
Argonne National Laboratory, United States
Xiaolan Wu
Affiliation:
Faculty of Materials and Manufacturing, Key Laboratory of Advanced Functional Materials, Education Ministry of China, Beijing University of Technology, Beijing, China, United States
Si Chen
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States

Abstract

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Type
Multi-Modal Multi-Dimensional Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 302 - 304
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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