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Recent Progress of Correlative Transmission Electron Microscopy and Atom Probe Tomography for Materials Characterization

Published online by Cambridge University Press:  04 August 2017

Wei Guo ,
Brian T. Sneed ,
Yifei Meng ,
David A. Cullen ,
Jian-min Zuo  and
Jonathan D. Poplawsky
Wei Guo
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Brian T. Sneed
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Yifei Meng
Affiliation:
Department of Material Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL, USA
David A. Cullen
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Jian-min Zuo
Affiliation:
Department of Material Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL, USA
Jonathan D. Poplawsky
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 692 - 693
Copyright
© Microscopy Society of America 2017 

References

[1] Guo, W, etal, Phys. Rev. Lett. 113 2014). p. 035501.Google Scholar
[2] Meng, Y, et al, Iucrj 3 2016). p. 300.Google Scholar
[3] Guo, W, et al, Microsc. Microanal. 22 2016). p. 1251.Google Scholar
[4] Research supported by Oak Ridge National Laboratory's Center for Nanophase Materials Sciences (CNMS), which is a U.S. Department of Energy (DOE) Office of Science User Facility.Google Scholar