Estivill, Robert Juhel, Marc Servanton, Germain Gregoire, Magali Lorut, Fréderic Clement, Laurent Chevalier, Pascal Grenier, Adeline and Blavette, Didier 2017. Boron atomic-scale mapping in advanced microelectronics by atom probe tomography. Applied Physics Letters, Vol. 110, Issue. 25, p. 252105.
White, L. F. Darling, J. R. Moser, D. E. Reinhard, D. A. Prosa, T. J. Bullen, D. Olson, D. Larson, D. J. Lawrence, D. and Martin, I. 2017. Atomic-scale age resolution of planetary events. Nature Communications, Vol. 8, p. 15597.
Prosa, Ty J. and Larson, David J. 2017. Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography. Microscopy and Microanalysis, Vol. 23, Issue. 02, p. 194.
Gin, S. Jollivet, P. Barba Rossa, G. Tribet, M. Mougnaud, S. Collin, M. Fournier, M. Cadel, E. Cabie, M. and Dupuy, L. 2017. Atom-Probe Tomography, TEM and ToF-SIMS study of borosilicate glass alteration rim: A multiscale approach to investigating rate-limiting mechanisms. Geochimica et Cosmochimica Acta, Vol. 202, p. 57.
Tu, Y. Takamizawa, H. Han, B. Shimizu, Y. Inoue, K. Toyama, T. Yano, F. Nishida, A. and Nagai, Y. 2017. Influence of laser power on atom probe tomographic analysis of boron distribution in silicon. Ultramicroscopy, Vol. 173, p. 58.
Gries, Katharina Ines Schlechtweg, Julian Hille, Pascal Schörmann, Jörg Eickhoff, Martin and Volz, Kerstin 2017. Three dimensional reconstruction of InGaN nanodisks in GaN nanowires: Improvement of the nanowire sample preparation to avoid missing wedge effects. Journal of Crystal Growth, Vol. 475, p. 202.
Bonef, Bastien Boukari, Hervé Grenier, Adeline Mouton, Isabelle Jouneau, Pierre-Henri Kinjo, Hidekazu and Kuroda, Shinji 2017. Atomic Scale Structural Characterization of Epitaxial (Cd,Cr)Te Magnetic Semiconductor. Microscopy and Microanalysis, Vol. 23, Issue. 04, p. 717.
Melkonyan, D. Fleischmann, C. Arnoldi, L. Demeulemeester, J. Kumar, A. Bogdanowicz, J. Vurpillot, F. and Vandervorst, W. 2017. Atom probe tomography analysis of SiGe fins embedded in SiO 2 : Facts and artefacts. Ultramicroscopy, Vol. 179, p. 100.
Kolli, R. Prakash 2017. Controlling residual hydrogen gas in mass spectra during pulsed laser atom probe tomography. Advanced Structural and Chemical Imaging, Vol. 3, Issue. 1,
Kim, Yoon-Jun Zhao, Li-Dong Kanatzidis, Mercouri G. and Seidman, David N. 2017. Analysis of Nanoprecipitates in a Na-Doped PbTe–SrTe Thermoelectric Material with a High Figure of Merit. ACS Applied Materials & Interfaces, Vol. 9, Issue. 26, p. 21791.
Kwak, Chang-Min Kim, Young-Tae Park, Chan-Gyung and Seol, Jae-Bok 2017. Understanding of Capping Effects on the Tip Shape Evolution and on the Atom Probe Data of Bulk LaAlO3 Using Transmission Electron Microscopy. Microscopy and Microanalysis, Vol. 23, Issue. 02, p. 329.
Chen, Shun-Tong and Yang, Shih-Wei 2017. A high-density, super-high-aspect-ratio microprobe array realized by high-frequency vibration assisted inverse micro w-EDM. Journal of Materials Processing Technology, Vol. 250, p. 144.
OHNO, Y. INOUE, K. FUJIWARA, K. KUTSUKAKE, K. DEURA, M. YONENAGA, I. EBISAWA, N. SHIMIZU, Y. INOUE, K. NAGAI, Y. YOSHIDA, H. TAKEDA, S. TANAKA, S. and KOHYAMA, M. 2017. Nanoscopic analysis of oxygen segregation at tilt boundaries in silicon ingots using atom probe tomography combined with TEM and ab initio calculations. Journal of Microscopy,
Yi, Gaosong Littrell, Kenneth C. Poplawsky, Jonathan D. Cullen, David A. Sundberg, Erik and Free, Michael L. 2017. Characterization of the effects of different tempers and aging temperatures on the precipitation behavior of Al-Mg (5.25 at.%)-Mn alloys. Materials & Design, Vol. 118, p. 22.
Kelly, Thomas F. 2017. Atomic-Scale Analytical Tomography. Microscopy and Microanalysis, Vol. 23, Issue. 01, p. 34.
Yi, Gaosong Zeng, Weizhi Poplawsky, Jonathan D. Cullen, David A. Wang, Zhifen and Free, Michael L. 2017. Characterizing and modeling the precipitation of Mg-rich phases in Al 5xxx alloys aged at low temperatures. Journal of Materials Science & Technology, Vol. 33, Issue. 9, p. 991.
Pfeiffer, Björn Maier, Johannes Arlt, Jonas and Nowak, Carsten 2017. In Situ Atom Probe Deintercalation of Lithium-Manganese-Oxide. Microscopy and Microanalysis, Vol. 23, Issue. 02, p. 314.
Adineh, Vahid R. Marceau, Ross K.W. Chen, Yu Si, Kae J. Velkov, Tony Cheng, Wenlong Li, Jian and Fu, Jing 2017. Pulsed-voltage atom probe tomography of low conductivity and insulator materials by application of ultrathin metallic coating on nanoscale specimen geometry. Ultramicroscopy, Vol. 181, p. 150.
Mburu, Sarah Kolli, R. Prakash Perea, Daniel E. Schwarm, Samuel C. Eaton, Arielle Liu, Jia Patel, Shiv Bartrand, Jonah and Ankem, Sreeramamurthy 2017. Effect of aging temperature on phase decomposition and mechanical properties in cast duplex stainless steels. Materials Science and Engineering: A, Vol. 690, p. 365.
Vandervorst, W. Fleischmann, C. Bogdanowicz, J. Franquet, A. Celano, U. Paredis, K. and Budrevich, A. 2017. Dopant, composition and carrier profiling for 3D structures. Materials Science in Semiconductor Processing, Vol. 62, p. 31.
Several FIB-based methods that have been developed to fabricate needle-shaped atom probe specimens from a variety of specimen geometries, and site-specific regions are reviewed. These methods have enabled electronic device structures to be characterized. The atom probe may be used to quantify the level and range of gallium implantation and has demonstrated that the use of low accelerating voltages during the final stages of milling can dramatically reduce the extent of gallium implantation.
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