Tu, Y. Takamizawa, H. Han, B. Shimizu, Y. Inoue, K. Toyama, T. Yano, F. Nishida, A. and Nagai, Y. 2017. Influence of laser power on atom probe tomographic analysis of boron distribution in silicon. Ultramicroscopy, Vol. 173, p. 58.
Yi, Gaosong Littrell, Kenneth C. Poplawsky, Jonathan D. Cullen, David A. Sundberg, Erik and Free, Michael L. 2017. Characterization of the effects of different tempers and aging temperatures on the precipitation behavior of Al-Mg (5.25at.%)-Mn alloys. Materials & Design, Vol. 118, p. 22.
Adineh, Vahid R. Marceau, Ross K. W. Velkov, Tony Li, Jian and Fu, Jing 2016. Near-Atomic Three-Dimensional Mapping for Site-Specific Chemistry of ‘Superbugs’. Nano Letters, Vol. 16, Issue. 11, p. 7113.
Baik, Sung-Il Duhin, Alla Phillips, Patrick J. Klie, Robert F. Gileadi, Eliezer Seidman, David N. and Eliaz, Noam 2016. Atomic-Scale Structural and Chemical Study of Columnar and Multilayer Re-Ni Electrodeposited Thermal Barrier Coating . Advanced Engineering Materials, Vol. 18, Issue. 7, p. 1133.
Belz, Jürgen Beyer, Andreas Torunski, Torsten Stolz, Wolfgang and Volz, Kerstin 2016. Direct investigation of (sub-) surface preparation artifacts in GaAs based materials by FIB sectioning. Ultramicroscopy, Vol. 163, p. 19.
Blum, I. Cuvilly, F. and Lefebvre-Ulrikson, W. 2016. Atom Probe Tomography.
Branson, Oscar Bonnin, Elisa A. Perea, Daniel E. Spero, Howard J. Zhu, Zihua Winters, Maria Hönisch, Bärbel Russell, Ann D. Fehrenbacher, Jennifer S. and Gagnon, Alexander C. 2016. Nanometer-Scale Chemistry of a Calcite Biomineralization Template: Implications for Skeletal Composition and Nucleation. Proceedings of the National Academy of Sciences, Vol. 113, Issue. 46, p. 12934.
Chae, B.-G. Seol, J.-B. Song, J.-H. Jung, W.-Y Hwang, H. and Park, C.-G. 2016. Atomic-scale quantification of interdiffusion and dopant localization in GeSbTe-based memory devices. Applied Physics Letters, Vol. 109, Issue. 11, p. 112103.
Chen, Wanghua Pareige, Philippe and Roca i Cabarrocas, Pere 2016. Three-dimensional atomic mapping of hydrogenated polymorphous silicon solar cells. Applied Physics Letters, Vol. 108, Issue. 25, p. 253110.
Estivill, Robert Audoit, Guillaume Barnes, Jean-Paul Grenier, Adeline and Blavette, Didier 2016. Preparation and Analysis of Atom Probe Tips by Xenon Focused Ion Beam Milling. Microscopy and Microanalysis, Vol. 22, Issue. 03, p. 576.
Gin, S. Jollivet, P. Barba Rossa, G. Tribet, M. Mougnaud, S. Collin, M. Fournier, M. Cadel, E. Cabie, M. and Dupuy, L. 2016. Atom-Probe Tomography, TEM and ToF-SIMS study of borosilicate glass alteration rim: a multiscale approach to investigating rate-limiting mechanisms. Geochimica et Cosmochimica Acta,
Gurbatov, Stanislav Kuchmizhak, Aleksandr Vitrik, Oleg and Kulchin, Yuri 2016. Lens-free laser nanopatterning of large-scale metal film areas with structured light for biosensing applications. Optics Express, Vol. 24, Issue. 17, p. 18898.
Hirai, Yutaro Kim, Yun Yukawa, Tsuyoshi and Owari, Masanori 2016. Study on a Novel Sample Preparation Method for Organic Materials in Atom Probe Tomography. e-Journal of Surface Science and Nanotechnology, Vol. 14, p. 154.
Hoffman, Emily E. Lin, Alex Liao, Yifeng and Marks, Laurence D. 2016. Grain Boundary Assisted Crevice Corrosion in CoCrMo Alloys. CORROSION, Vol. 72, Issue. 11, p. 1445.
Huang, Ting-Yun Marvel, Christopher J. Cantwell, Patrick R. Harmer, Martin P. and Schuh, Christopher A. 2016. Grain boundary segregation in Al–Mn electrodeposits prepared from ionic liquid. Journal of Materials Science, Vol. 51, Issue. 1, p. 438.
Khan, Mansoor Ali Ringer, Simon P. and Zheng, Rongkun 2016. Atom Probe Tomography on Semiconductor Devices. Advanced Materials Interfaces, Vol. 3, Issue. 12, p. 1500713.
Kim, Yoon-Jun Baik, Sung-Il Bertolucci-Coelho, Leonardo Mazzaferro, Luca Ramirez, Giovanni Erdermir, Ali and Seidman, David N. 2016. Atom-probe tomography of tribological boundary films resulting from boron-based oil additives. Scripta Materialia, Vol. 111, p. 64.
Kolli, R. Prakash Herzing, Andrew A. and Ankem, Sreeramamurthy 2016. Characterization of yttrium-rich precipitates in a titanium alloy weld. Materials Characterization, Vol. 122, p. 30.
Lemmens, B. Springer, H. Duarte, M.J. De Graeve, I. De Strycker, J. Raabe, D. and Verbeken, K. 2016. Atom probe tomography of intermetallic phases and interfaces formed in dissimilar joining between Al alloys and steel. Materials Characterization, Vol. 120, p. 268.
Mancini, L. Hernández-Maldonado, D. Lefebvre, W. Houard, J. Blum, I. Vurpillot, F. Eymery, J. Durand, C. Tchernycheva, M. and Rigutti, L. 2016. Multi-microscopy study of the influence of stacking faults and three-dimensional In distribution on the optical properties of m-plane InGaN quantum wells grown on microwire sidewalls. Applied Physics Letters, Vol. 108, Issue. 4, p. 042102.
Several FIB-based methods that have been developed to fabricate needle-shaped atom probe specimens from a variety of specimen geometries, and site-specific regions are reviewed. These methods have enabled electronic device structures to be characterized. The atom probe may be used to quantify the level and range of gallium implantation and has demonstrated that the use of low accelerating voltages during the final stages of milling can dramatically reduce the extent of gallium implantation.
This list contains references from the content that can be linked to their source. For a full set of references and notes please see the PDF or HTML where available.
Email your librarian or administrator to recommend adding this journal to your organisation's collection.
Full text views reflects the number of PDF downloads, PDFs sent to Google Drive, Dropbox and Kindle and HTML full text views.
Abstract views reflect the number of visits to the article landing page.
* Views captured on Cambridge Core between September 2016 - 29th March 2017. This data will be updated every 24 hours.