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Smart Scanning Ion-Conductance Microscopy Imaging Technique Using Horizontal Fast Scanning Method

Published online by Cambridge University Press:  07 June 2018

Jian Zhuang ,
Zhiwu Wang ,
Zeqing Li ,
Pengbo Liang  and
Mugubo Vincent
Jian Zhuang*
Affiliation:
Key Laboratory of Education Ministry for Modern Design Rotor-Bearing System, Xi’an Jiaotong University, Xi’an 710049, China School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an 710049, China
Zhiwu Wang
Affiliation:
Key Laboratory of Education Ministry for Modern Design Rotor-Bearing System, Xi’an Jiaotong University, Xi’an 710049, China School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an 710049, China
Zeqing Li
Affiliation:
School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an 710049, China
Pengbo Liang
Affiliation:
Key Laboratory of Education Ministry for Modern Design Rotor-Bearing System, Xi’an Jiaotong University, Xi’an 710049, China School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an 710049, China
Mugubo Vincent
Affiliation:
Key Laboratory of Education Ministry for Modern Design Rotor-Bearing System, Xi’an Jiaotong University, Xi’an 710049, China School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an 710049, China
*
Author for correspondence: Jian Zhuang, E-mail: zhuangjian@mail.xjtu.edu.cn
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Abstract

To solve extended acquisition time issues inherent in the conventional hopping-scanning mode of scanning ion-conductance microscopy (SICM), a new transverse-fast scanning mode (TFSM) is proposed. Because the transverse motion in SICM is not the detection direction and therefore presents no collision problem, it has the ability to move at high speed. In TSFM, the SICM probe gradually descends in the vertical/detection direction and rapidly scans in the transverse/nondetection direction. Further, the highest point that decides the hopping height of each scanning line can be quickly obtained. In conventional hopping mode, however, the hopping height is artificially set without a priori knowledge and is typically very large. Consequently, TFSM greatly improves the scanning speed of the SICM imaging system by effectively reducing the hopping height of each pixel. This study verifies the feasibility of this novel scanning method via theoretical analysis and experimental study, and compares the speed and quality of the scanning images obtained in the TFSM with that of the conventional hopping mode. The experimental results indicate that the TFSM method has a faster scanning speed than other SICM scanning methods while maintaining the quality of the images. Therefore, TFSM provides the possibility to quickly obtain high-resolution three-dimensional topographical images of extremely complex samples.

Keywords

scanning ion-conductance microscopy (SICM)transverse-fast scanning mode (TFSM)living cellsimaging speedimaging stability
Type
Software and Instrumentation
Information
Microscopy and Microanalysis , Volume 24 , Issue 3 , June 2018 , pp. 264 - 276
Copyright
© Microscopy Society of America 2018 

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Footnotes

Cite this article: Zhuang J, Wang Z, Li Z, Liang P, Vincent M (2018) Smart Scanning Ion-Conductance Microscopy Imaging Technique Using Horizontal Fast Scanning Method. Microsc Microanal24(3): 264–276. doi: 10.1017/S1431927618000375

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