Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Kuramochi, Koji
Suzuki, Kentaro
Yamazaki, Takashi
Mitsuishi, Kazutaka
Furuya, Kazuo
Hashimoto, Iwao
and
Watanabe, Kazuto
2008.
Quantitative structural analysis of twin boundary in α-Zn7Sb2O12 using HAADF STEM method.
Ultramicroscopy,
Vol. 109,
Issue. 1,
p.
96.
Kisielowski, C.
Freitag, B.
Bischoff, M.
van Lin, H.
Lazar, S.
Knippels, G.
Tiemeijer, P.
van der Stam, M.
von Harrach, S.
Stekelenburg, M.
Haider, M.
Uhlemann, S.
Müller, H.
Hartel, P.
Kabius, B.
Miller, D.
Petrov, I.
Olson, E.A.
Donchev, T.
Kenik, E.A.
Lupini, A.R.
Bentley, J.
Pennycook, S.J.
Anderson, I.M.
Minor, A.M.
Schmid, A.K.
Duden, T.
Radmilovic, V.
Ramasse, Q.M.
Watanabe, M.
Erni, R.
Stach, E.A.
Denes, P.
and
Dahmen, U.
2008.
Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit.
Microscopy and Microanalysis,
Vol. 14,
Issue. 5,
p.
469.
Pennycook, S.J.
Chisholm, M.F.
Lupini, A.R.
Varela, M.
van Benthem, K.
Borisevich, A.Y.
Oxley, M.P.
Luo, W.
and
Pantelides, S.T.
2008.
Advances in IMAGING AND ELECTRON PHYSICS - Aberration–Corrected Electron Microscopy.
Vol. 153,
Issue. ,
p.
327.
Lupini, A.R.
Borisevich, A.Y.
Idrobo, J.C.
Christen, H.M.
Biegalski, M.
and
Pennycook, S.J.
2009.
Characterizing the Two- and Three-Dimensional Resolution of an Improved Aberration-Corrected STEM.
Microscopy and Microanalysis,
Vol. 15,
Issue. 5,
p.
441.
Bangert, U.
Gass, M. H.
Bleloch, A. L.
Nair, R. R.
and
Geim, A. K.
2009.
Manifestation of ripples in free‐standing graphene in lattice images obtained in an aberration‐corrected scanning transmission electron microscope.
physica status solidi (a),
Vol. 206,
Issue. 6,
p.
1117.
Molina, S.I.
Sales, D.L.
Galindo, P.L.
Fuster, D.
González, Y.
Alén, B.
González, L.
Varela, M.
and
Pennycook, S.J.
2009.
Column-by-column compositional mapping by Z-contrast imaging.
Ultramicroscopy,
Vol. 109,
Issue. 2,
p.
172.
Pennycook, S. J.
Chisholm, M. F.
Lupini, A. R.
Varela, M.
Borisevich, A. Y.
Oxley, M. P.
Luo, W. D.
van Benthem, K.
Oh, S.-H.
Sales, D. L.
Molina, S. I.
García-Barriocanal, J.
Leon, C.
Santamaría, J.
Rashkeev, S. N.
and
Pantelides, S. T.
2009.
Aberration-corrected scanning transmission electron microscopy: from atomic imaging and analysis to solving energy problems.
Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences,
Vol. 367,
Issue. 1903,
p.
3709.
Kuramochi, Koji
Yamazaki, Takashi
Kotaka, Yasutoshi
Ohtsuka, Masahiro
Hashimoto, Iwao
and
Watanabe, Kazuto
2009.
Effect of chromatic aberration on atomic-resolved spherical aberration corrected STEM images.
Ultramicroscopy,
Vol. 110,
Issue. 1,
p.
36.
Dahmen, Ulrich
Erni, Rolf
Radmilovic, Velimir
Ksielowski, Christian
Rossell, Marta-Dacil
and
Denes, Peter
2009.
Background, status and future of the Transmission Electron Aberration-corrected Microscope project.
Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences,
Vol. 367,
Issue. 1903,
p.
3795.
Senoner, Mathias
Wirth, Thomas
and
Unger, Wolfgang E. S.
2010.
Imaging surface analysis: Lateral resolution and its relation to contrast and noise.
Journal of Analytical Atomic Spectrometry,
Vol. 25,
Issue. 9,
p.
1440.
Su, Dong
and
Zhu, Yimei
2010.
Scanning moiré fringe imaging by scanning transmission electron microscopy.
Ultramicroscopy,
Vol. 110,
Issue. 3,
p.
229.
Pennycook, Stephen J.
2011.
Scanning Transmission Electron Microscopy.
p.
1.
van Benthem, K.
and
Pennycook, S.J.
2011.
Comprehensive Semiconductor Science and Technology.
p.
287.
Kirkland, Earl J.
2011.
On the optimum probe in aberration corrected ADF-STEM.
Ultramicroscopy,
Vol. 111,
Issue. 11,
p.
1523.
van Benthem, Klaus
2012.
Sintering.
Vol. 35,
Issue. ,
p.
215.
Pennycook, S.J.
2012.
Seeing the atoms more clearly: STEM imaging from the Crewe era to today.
Ultramicroscopy,
Vol. 123,
Issue. ,
p.
28.
Hovden, Robert
Xin, Huolin L.
and
Muller, David A.
2012.
Channeling of a subangstrom electron beam in a crystal mapped to two-dimensional molecular orbitals.
Physical Review B,
Vol. 86,
Issue. 19,
Sasaki, Takeo
Sawada, Hidetaka
Okunishi, Eiji
Hosokawa, Fumio
Kaneyama, Toshikatsu
Kondo, Yukihito
Kimoto, Koji
and
Suenaga, Kazu
2012.
Evaluation of probe size in STEM imaging at 30 and 60kV.
Micron,
Vol. 43,
Issue. 4,
p.
551.
Rodriguez, Brian J.
Proksch, Roger
Maksymovych, Peter
and
Kalinin, Sergei V.
2012.
Handbook of Nanoscopy.
p.
539.
Pennycook, Stephen J.
Lupini, Anrew R.
Borisevich, Albina Y.
and
Oxley, Mark P.
2012.
Handbook of Nanoscopy.
p.
109.