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Spectroscopic Imaging of Oxide Interfaces with Aberration Corrected Probes

Published online by Cambridge University Press:  05 August 2007

M Varela ,
M Oxley ,
K Griffin Roberts ,
J Garcia-Barriocanal ,
AR Lupini ,
S Rashkeev ,
C Leon ,
K Krishnan ,
J Santamaria  and
ST Pantelides
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M Varela
Affiliation:
Oak Ridge National Laboratory
M Oxley
Affiliation:
Oak Ridge National Laboratory
K Griffin Roberts
Affiliation:
University of Washington,Seattle
J Garcia-Barriocanal
Affiliation:
Universidad Complutense de Madrid,Spain
AR Lupini
Affiliation:
Oak Ridge National Laboratory
S Rashkeev
Affiliation:
Idaho National Laboratory
C Leon
Affiliation:
Universidad Complutense de Madrid,Spain
K Krishnan
Affiliation:
University of Washington,Seattle
J Santamaria
Affiliation:
Universidad Complutense de Madrid,Spain
ST Pantelides
Affiliation:
Oak Ridge National Laboratory
S Pennycook
Affiliation:
Oak Ridge National Laboratory
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 142 - 143
Copyright
© 2007 Microscopy Society of America

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