Skip to main content Accessibility help
×
Home
Hostname: page-component-568f69f84b-jg9p7 Total loading time: 0.256 Render date: 2021-09-17T13:15:42.219Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": true, "newCiteModal": false, "newCitedByModal": true, "newEcommerce": true, "newUsageEvents": true }

STEM EBIC Mapping of the Metal-Insulator Transition in Thin-film NbO2

Published online by Cambridge University Press:  04 August 2017

William A. Hubbard
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA
Toyanath Joshi
Affiliation:
Department of Physics and Astronomy, West Virginia University, Morgantown, WV, USA
Matthew Mecklenburg
Affiliation:
Center for Electron Microscopy and Microanalysis, University of Southern California, Los Angeles, CA, USA
Brian Zutter
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA
Pavel Borisov
Affiliation:
Department of Physics and Astronomy, West Virginia University, Morgantown, WV, USA
David Lederman
Affiliation:
Department of Physics and Astronomy, West Virginia University, Morgantown, WV, USA Department of Physics, University of California, Santa Cruz, CA, USA
B. C. Regan
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA
Rights & Permissions[Opens in a new window]

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Bolzan, AA, et al, Journal of Solid State Chemistry 113 1994). p. 914.CrossRefGoogle Scholar
[2] Joshi, T, et al, Journal of Physics D: Applied Physics 48 2015). p. 335308.CrossRefGoogle Scholar
[3] Hubbard, WA, et al, Microscopy and Microanalysis 22(S3 2016). p. 12541255.CrossRefGoogle Scholar
[4] This work has been supported by FAME, one of six centers of STARnet, a Semiconductor Research Corporation program sponsored by MARCO and DARPA, by National Science Foundation (NSF) award DMR-1611036, and by NSF STC award DMR-1548924. The authors acknowledge the use of instruments at the Electron Imaging Center for NanoMachines supported by NIH 1S10RR23057 and the CNSI at UCLA, as well as the Shared Research Facilities at WVU.Google Scholar
You have Access
1
Cited by

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

STEM EBIC Mapping of the Metal-Insulator Transition in Thin-film NbO2
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

STEM EBIC Mapping of the Metal-Insulator Transition in Thin-film NbO2
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

STEM EBIC Mapping of the Metal-Insulator Transition in Thin-film NbO2
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *