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STEM EBIC Mapping of the Metal-Insulator Transition in Thin-film NbO2

  • William A. Hubbard (a1), Toyanath Joshi (a2), Matthew Mecklenburg (a3), Brian Zutter (a1), Pavel Borisov (a2), David Lederman (a2) (a4) and B. C. Regan (a1)...
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[1] Bolzan, AA, et al, Journal of Solid State Chemistry 113 1994). p. 914.
[2] Joshi, T, et al, Journal of Physics D: Applied Physics 48 2015). p. 335308.
[3] Hubbard, WA, et al, Microscopy and Microanalysis 22(S3 2016). p. 12541255.
[4] This work has been supported by FAME, one of six centers of STARnet, a Semiconductor Research Corporation program sponsored by MARCO and DARPA, by National Science Foundation (NSF) award DMR-1611036, and by NSF STC award DMR-1548924. The authors acknowledge the use of instruments at the Electron Imaging Center for NanoMachines supported by NIH 1S10RR23057 and the CNSI at UCLA, as well as the Shared Research Facilities at WVU.
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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