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Structural and Chemical Characterization of Yb2O3-ZrO2 System by HAADF-STEM and HRTEM

Published online by Cambridge University Press:  15 January 2009

C. Angeles-Chavez ,
P. Salas ,
L.A. Díaz-Torres ,
E. de la Rosa ,
R. Esparza  and
R. Perez
C. Angeles-Chavez*
Affiliation:
Instituto Mexicano del Petroleo, Programa de Ingeniería Molecular, Eje Central Lazaro Cardenas 152, A. P. 14-805, 07730 México, D. F.Mexico
P. Salas
Affiliation:
Centro de Física Aplicada y Tecnología Avanzada, Universidad Nacional Autónoma de México, A. P. 1-1010, Querétaro 76000, Mexico
L.A. Díaz-Torres
Affiliation:
Centro de Investigaciones en Optica, A. P. 1-948, León Gto. 37150, Mexico
E. de la Rosa
Affiliation:
Centro de Investigaciones en Optica, A. P. 1-948, León Gto. 37150, Mexico
R. Esparza
Affiliation:
Instituto de Ciencias Físicas, Universidad Nacional Autónoma de México, P.O. Box 48-3, 62210 Cuernavaca, Mor. Mexico
R. Perez
Affiliation:
Instituto de Ciencias Físicas, Universidad Nacional Autónoma de México, P.O. Box 48-3, 62210 Cuernavaca, Mor. Mexico
*
Corresponding author. E-mail: cangeles@imp.mx
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Abstract

ZrO2:Yb3+ nanocrystalline phosphors with high concentrations of ytterbium ions were prepared using the sol-gel method. X-ray diffraction, high-angle annular-dark-field scanning transmission electron microscopy (HAADF-STEM), energy dispersive X-ray spectroscopy, and high-resolution transmission electron microscopy (HRTEM) were used to characterize the nanocrystalline phosphors annealed at 1000°C. Unit-cell distortion and changes in the crystalline structure of the monoclinic zirconia to tetragonal zirconia, and subsequently cubic zirconia, were observed with increased Yb concentration. Yb ions were randomly distributed into the lattice of the crystalline structure. No segregation of Yb2O3 phase was observed. The substitution of Zr atoms by Yb atoms on different crystalline phases was confirmed by the experimental results and theoretical simulations of HRTEM and HAADF-STEM.

Keywords

ZrO2YbnanophosphorHAADF-STEMSTEM-EDXSHRTEM
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 15 , Issue 1 , February 2009 , pp. 46 - 53
Copyright
Copyright © Microscopy Society of America 2009

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