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Study of Selected Grain Boundaries in CdTe by Aberration-corrected STEM

Published online by Cambridge University Press:  23 November 2012

C. Li ,
A.R. Lupini ,
D.N. Leonard ,
C.M. Parish ,
S.J. Pennycook ,
T.J. Pennycook ,
M.J. Romero ,
H. Moutinho ,
M. Al-Jassim  and
Y. Yan
C. Li
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
A.R. Lupini
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
D.N. Leonard
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
C.M. Parish
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
S.J. Pennycook
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
T.J. Pennycook
Affiliation:
Department of Physics and Astronomy, Vanderbilt University, Nashville, TN
M.J. Romero
Affiliation:
The Measurements and Characterization Group, National Renewable Energy Laboratory, Golden, CO
H. Moutinho
Affiliation:
The Measurements and Characterization Group, National Renewable Energy Laboratory, Golden, CO
M. Al-Jassim
Affiliation:
The Measurements and Characterization Group, National Renewable Energy Laboratory, Golden, CO
Y. Yan
Affiliation:
Department of Physics and Astronomy, The University of Toledo, Toledo, OH
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 424 - 425
Copyright
Copyright © Microscopy Society of America 2012

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