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The Sub-Electron-Volt-Sub-Angstrom-Microscope (SESAM): Pushing the Limits in Monochromated and Energy-Filtered TEM.

  • PA van Aken (a1), CT Koch (a1), W Sigle (a1), R Höschen (a1), M Rühle (a1), E Essers (a2), G Benner (a2) and M Matijevic (a2)...
Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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