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Substitutional and Interstitial Diffusion of Ni across the NiSi/Si interface

  • A. Thron (a1), K. van Benthem (a1), J. Chan (a2), C.L. Hinkle (a2), T.J. Pennycook (a3), S.J. Pennycook (a3) and A. Jain (a4)...


Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.


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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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