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Microscopy and Microanalysis Microscopy and Microanalysis

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Substitutional Si Doping of Graphene and Nanotubes through Ion Irradiation-Induced Vacancies

Published online by Cambridge University Press:  05 August 2019

Heena Inani ,
Kimmo Mustonen ,
Alexander Markevich ,
Er-Xiong Ding ,
Mukesh Tripathi ,
Aqeel Hussian ,
Clemens Mangler ,
Esko I. Kauppinen ,
Toma Susi  and
Jani Kotakoski
Heena Inani
Affiliation:
University of Vienna, Faculty of Physics & VDSP, Vienna, Austria.
Kimmo Mustonen
Affiliation:
University of Vienna, Faculty of Physics & VDSP, Vienna, Austria.
Alexander Markevich
Affiliation:
University of Vienna, Faculty of Physics & VDSP, Vienna, Austria.
Er-Xiong Ding
Affiliation:
Aalto School of Science, Department of Applied Physics, Aalto, Finland.
Mukesh Tripathi
Affiliation:
University of Vienna, Faculty of Physics & VDSP, Vienna, Austria.
Aqeel Hussian
Affiliation:
Aalto School of Science, Department of Applied Physics, Aalto, Finland.
Clemens Mangler
Affiliation:
University of Vienna, Faculty of Physics & VDSP, Vienna, Austria. Aalto School of Science, Department of Applied Physics, Aalto, Finland.
Esko I. Kauppinen
Affiliation:
Aalto School of Science, Department of Applied Physics, Aalto, Finland.
Toma Susi
Affiliation:
University of Vienna, Faculty of Physics & VDSP, Vienna, Austria.
Jani Kotakoski
Affiliation:
University of Vienna, Faculty of Physics & VDSP, Vienna, Austria.
Corresponding
E-mail address:
heena.inani@univie.ac.at
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Abstract

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Type
Microscopy and Microanalysis of Nuclear and Irradiated Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1574 - 1575
Copyright
Copyright © Microscopy Society of America 2019 

References

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[2]Bangert, U et al. , Nano Lett. 13 (2013), p. 4902.CrossRefGoogle Scholar
[3]Ramasse, QM et al. , Nano Lett. 13 (2013), p. 4989.CrossRefGoogle Scholar
[4]Tripathi, M et al. , ACS Nano 12 (2018), p. 4641.CrossRefGoogle Scholar
[5]Arenal, R et al. Nano Lett. 14 (2014), p. 5509.CrossRefGoogle Scholar
[6]Mustonen, K et al. ACS Nano 12 (2018), p. 8512.CrossRefGoogle Scholar
[7]Leuthner, GT et al. , DOI: j.ultramic.2019.02.002 (2019).CrossRefGoogle Scholar
[8]Tripathi, M et al. , Physica Status Solidi RRL 11 (2017), p. 1700124.CrossRefGoogle Scholar
[9]Tolvanen, A et al. , Appl. Phys. Lett. 91 (2007), p. 173109.CrossRefGoogle Scholar
[10]Inani, H et al. , arXiv:1902.02611Google Scholar
[11]The authors acknowledge funding by the FWF project I3181-N36, P 28322-N36 and P31605, Wiener Wissenschafts-Forschungs- und Technologiefonds (WWTF) project MA14-009, European Research Council (ERC) Grant No. 756277-ATMEN, Finnish Cultural Foundation through a grant from the Finnish Postdoc Pool and projects 286546DEMEC, 292600-SUPER, 3303/31/2015 (CNT-PV), 1882/31/2016 (FEDOC) and the Aalto Energy Efficiency (AEF) Research Program through the MOPPI project. Ms. Heena Inani is thankful to Vienna Doctoral of Physics for providing additional support.Google Scholar

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