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TEM Characterization of the Deformed Region Beneath Knoop Indents in Boron Carbide

  • S. D. Walck (a1), J. C. LaSalvia (a2) and K. D. Behler (a3)
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References
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[1] Madhav Reddy, K., et al., Nature Communications 10(1038 (2013). p. 3483.
[2] Brennan, C.V, Walck, S.D & Swab, J. J. Microscopy and Microanalysis 20(6 (2014). p. 1646.
[3] Swab, J. J., et al., Microscopy and Microanalysis 21(S3 (2015). p. 315.
[4] The research reported in this document was performed in connection with contract/instrument W911QX-14-C-0016 with the U.S. Army Research Laboratory. The views and conclusions contained in this document are those of TKC Global and the U.S. Army Research Laboratory.
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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