Hostname: page-component-8448b6f56d-tj2md Total loading time: 0 Render date: 2024-04-24T22:54:01.605Z Has data issue: false hasContentIssue false
  • English
  • Français

A Three Beam Approach to TEM Preparation Using In-situ Low Voltage Argon Ion Final Milling in a FIB-SEM Instrument

Published online by Cambridge University Press:  01 August 2005

E L Principe ,
P Gnauck  and
P Hoffrogge
E L Principe
Affiliation:
Carl Zeiss SMT,Inc.
P Gnauck
Affiliation:
Carl Zeiss SMT,Inc.
P Hoffrogge
Affiliation:
Carl Zeiss SMT,Inc.

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 830 - 831
Copyright
© 2005 Microscopy Society of America