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Three-Dimensional Electrostatic Field at an Electron Nano-Emitter Determined by Differential Phase Contrast in Scanning Transmission Electron Microscopy

  • Mingjian Wu (a1), Alexander Tafel (a2), Peter Hommelhoff (a2) and Erdmann Spiecker (a1)
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      Three-Dimensional Electrostatic Field at an Electron Nano-Emitter Determined by Differential Phase Contrast in Scanning Transmission Electron Microscopy
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      Three-Dimensional Electrostatic Field at an Electron Nano-Emitter Determined by Differential Phase Contrast in Scanning Transmission Electron Microscopy
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[1]Wu, M., Tafel, A., Hommelhoff, P. and Spiecker, E., Applied Physics Letters 114 (2019) 013101.
[2]M.W. and E.S. acknowledge financial support by DFG via research training group GRK 1896 “In-situ Microscopy with Electrons, X-rays and Scanning Probes” and usage of instrumentation acquired within the DFG Cluster of Excellence EXC 315 “Engineering of Advanced Materials”. A.T. and P.H. acknowledge funding by the ERC grant “Near Field Atto.”

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