Wu, M., Tafel, A., Hommelhoff, P. and Spiecker, E., Applied Physics Letters114 (2019) 013101.CrossRefGoogle Scholar
M.W. and E.S. acknowledge financial support by DFG via research training group GRK 1896 “In-situ Microscopy with Electrons, X-rays and Scanning Probes” and usage of instrumentation acquired within the DFG Cluster of Excellence EXC 315 “Engineering of Advanced Materials”. A.T. and P.H. acknowledge funding by the ERC grant “Near Field Atto.”Google Scholar
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