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Three-Dimensional Electrostatic Field at an Electron Nano-Emitter Determined by Differential Phase Contrast in Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  05 August 2019

Mingjian Wu*
Affiliation:
Institute of Micro- and Nanostructure Reseaerch, Center for Nanoanalysis and Electron Microscopy (CENEM), University of Erlangen-Nuremberg, Erlangen, Germany.
Alexander Tafel
Affiliation:
Institute of Laser Physics, University of Erlangen-Nuremberg, Erlangen, Germany.
Peter Hommelhoff
Affiliation:
Institute of Laser Physics, University of Erlangen-Nuremberg, Erlangen, Germany.
Erdmann Spiecker*
Affiliation:
Institute of Micro- and Nanostructure Reseaerch, Center for Nanoanalysis and Electron Microscopy (CENEM), University of Erlangen-Nuremberg, Erlangen, Germany.
*
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Abstract

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Type
Advances in Phase Retrieval Microscopy
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Wu, M., Tafel, A., Hommelhoff, P. and Spiecker, E., Applied Physics Letters 114 (2019) 013101.CrossRefGoogle Scholar
[2]M.W. and E.S. acknowledge financial support by DFG via research training group GRK 1896 “In-situ Microscopy with Electrons, X-rays and Scanning Probes” and usage of instrumentation acquired within the DFG Cluster of Excellence EXC 315 “Engineering of Advanced Materials”. A.T. and P.H. acknowledge funding by the ERC grant “Near Field Atto.”Google Scholar
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Three-Dimensional Electrostatic Field at an Electron Nano-Emitter Determined by Differential Phase Contrast in Scanning Transmission Electron Microscopy
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