Hostname: page-component-8448b6f56d-42gr6 Total loading time: 0 Render date: 2024-04-24T23:00:36.785Z Has data issue: false hasContentIssue false

Three-dimensional imaging of single dopants inside crystals using multislice electron ptychography

Published online by Cambridge University Press:  30 July 2021

Zhen Chen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, New York, United States
Yu-Tsun Shao
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, Ithac, New York, United States
Yi Jiang
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Lemont, IL60439, USA, United States
David Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, Ithaca, New York, United States

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Defects in Materials: How We See and Understand Them
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

van Benthem, K, et al. , Ultramicroscopy 106 (2006), p. 1062-1068.CrossRefGoogle Scholar
Born, M and Wolf, E, (1989) Pergamon, New York.Google Scholar
Ishikawa, R, et al. , Physical Review Applied 13 (2020), 034064.Google Scholar
Xin, HL, et al. , Applied Physics Letters 92 (2008), 013125.CrossRefGoogle Scholar
Maiden, AM, et al. , Journal of the Optical Society of America A 29 (2012), p. 1606-1614.CrossRefGoogle Scholar
Chen, Z, et al., arXiv: 2101.00465 (2021).Google Scholar
Jiang, Y, et al. , Nature 559 (2018), p. 343.CrossRefGoogle Scholar
We thank L Caretta, CA Ross and GSD Beach for the garnet sample. Research supported by US NSF (grants DMR-1539918, DMR-1719875).Google Scholar