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Tomviz: An Open-Source Platform for Electron Tomography

Published online by Cambridge University Press:  22 July 2022

Jonathan Schwartz ,
Chris Harris ,
Jacob Pietryga ,
Jonathan Rowell ,
Brianna Major ,
Patrick Avery ,
Utkarsh Ayachit ,
Berk Geveci ,
Alessandro Genova  and
Cory Quammen
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Jonathan Schwartz
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, USA
Chris Harris
Affiliation:
Kitware, Inc., Clifton Park, NY, USA
Jacob Pietryga
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, USA Department of Materials Science and Engineering, Northwestern University, Evanston, IL, USA
Jonathan Rowell
Affiliation:
Department of Material Science and Engineering, Cornell University, Ithaca, NY, USA
Brianna Major
Affiliation:
Kitware, Inc., Clifton Park, NY, USA
Patrick Avery
Affiliation:
Kitware, Inc., Clifton Park, NY, USA
Utkarsh Ayachit
Affiliation:
Kitware, Inc., Clifton Park, NY, USA
Berk Geveci
Affiliation:
Kitware, Inc., Clifton Park, NY, USA
Alessandro Genova
Affiliation:
Kitware, Inc., Clifton Park, NY, USA
Cory Quammen
Affiliation:
Kitware, Inc., Clifton Park, NY, USA
Peter Ercius
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Yi Jiang
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA
Richard Robinson
Affiliation:
Department of Material Science and Engineering, Cornell University, Ithaca, NY, USA
Marcus D. Hanwell
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY, USA
Robert Hovden
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, USA Applied Physics Program, University of Michigan, Ann Arbor, MI, USA

Abstract

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Type
Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 3128 - 3130
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Copyright
Copyright © Microscopy Society of America 2022

References

De Rosier, D and Klug, A, A. Nature 217 (1968), p. 130.10.1038/217130a0CrossRefGoogle Scholar
Midgley, PA et al. , Chemical Communications 10 (2001), p. 907.10.1039/b101819cCrossRefGoogle Scholar
Leven, BDA et al. , Microscopy Today 1 (2018), p. 12.10.1017/S1551929517001213CrossRefGoogle Scholar
Schwartz, J et al. , npj Comput. Mater. 8 (2022), p. 16.10.1038/s41524-021-00692-5CrossRefGoogle Scholar
Ha, D et al. , Nano Lett. 14, p. 7090.10.1021/nl5035607CrossRefGoogle Scholar
tomviz is supported from DOE Office of Science contract DE-SC0011385.Google Scholar