Hostname: page-component-8448b6f56d-cfpbc Total loading time: 0 Render date: 2024-04-23T08:54:34.888Z Has data issue: false hasContentIssue false

Understanding Microstructural Evolution in ZrC Inoculated Zr47.5Cu45.5Al5Co2 Via High Resolution SIMS

Published online by Cambridge University Press:  05 August 2019

Brett Lewis*
Affiliation:
Carl Zeiss Microscopy LLC, USA
Muhammad Musaddique Ali Rafique
Affiliation:
RMIT University, Australia
Fouzia Khanom
Affiliation:
Carl Zeiss Microscopy LLC, USA
*
*Corresponding author: brett.lewis@zeiss.com

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Focused Ion Beam Instrumentation and Techniques
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Klement, W, Willens, RH and Duwez, POL, Nature 187 (1960), p. 869.Google Scholar
[2]Greer, AL, Science 267 (1995), p. 1947.Google Scholar
[3]Wang, W-H, Dong, C and Shek, C, Materials Science and Engineering: R: Reports 44 (2004), p. 45.Google Scholar
[4]Schroers, J and Johnson, WL, Physical Review Letters 93 (2004), p. 255506.Google Scholar
[5]Hofmann, DC et al. , Scientific reports 6 (2016), p. 37773.Google Scholar
[6]Hofmann, DC et al. , Advanced Engineering Materials 19 (2017), p. 1600541.Google Scholar
[7]Zhou, W, Weng, W and Hou, J, Journal of Materials Science & Technology 32 (2016), p. 349.Google Scholar
[8]Choi-Yim, H, Busch, R and Johnson, W, Journal of applied physics 83 (1998), p. 7993.Google Scholar
[9]Mahjoub, R et al. , Computational Materials Science 108 (2015), p. 94.Google Scholar
[10]Rafique, MMA, Engineering 10 (2018), p. 530.Google Scholar
[11]Rafique, MMA, Engineering 10 (2018), p. 215.Google Scholar
[12]Wirtz, T, Dowsett, D and Philipp, P in “Helium Ion Microscopy”, Springer (2016), p. 297-323.Google Scholar
[13]Ward, B, Notte, JA and Economou, N, JVSTB 24 (2006), p. 2871.Google Scholar