Skip to main content Accessibility help
×
Home
Hostname: page-component-684899dbb8-x64cq Total loading time: 0.226 Render date: 2022-05-16T16:45:50.756Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "useRatesEcommerce": false, "useNewApi": true }

The Use of Electron Ptychography to Implement Efficient Phase Imaging in STEM

Published online by Cambridge University Press:  25 July 2016

P D Nellist
Affiliation:
Department of Materials, University of Oxford, Parks Rd, Oxford UK.
H Yang
Affiliation:
Department of Materials, University of Oxford, Parks Rd, Oxford UK.
L Jones
Affiliation:
Department of Materials, University of Oxford, Parks Rd, Oxford UK.
G T Martinez
Affiliation:
Department of Materials, University of Oxford, Parks Rd, Oxford UK.
R N Rutte
Affiliation:
Department of Chemistry, University of Oxford, 12 Mansfield Road, OX1 3TA, Oxford UK.
B D Davis
Affiliation:
Department of Chemistry, University of Oxford, 12 Mansfield Road, OX1 3TA, Oxford UK.
T J Pennycook
Affiliation:
Department of Physics, University of Vienna, Boltzmanngasse 5, 1090 Vienna, Austria.
M Simson
Affiliation:
PNDetector GmbH, SckellstraBe 3, 81667 Miinchen, Germany.
M Huth
Affiliation:
PNDetector GmbH, SckellstraBe 3, 81667 Miinchen, Germany.
H Soltau
Affiliation:
PNDetector GmbH, SckellstraBe 3, 81667 Miinchen, Germany.
L Striider
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring t, 81739 Miinchen, Germany.
R Sa gawa
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo 196-8558Japan.
Y Kondo
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo 196-8558Japan.
Rights & Permissions[Opens in a new window]

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

[1] Nellist, P.D., McCallum, B.C. & Rodenburg, J.M. Nature 374 (1995) 630632.CrossRefGoogle Scholar
[2] Rodenburg, J.M., McCallum, B.C. & Nellist, P.D. Ultramicroscopy 48 (1993) 303314.CrossRefGoogle Scholar
[3] Pennycook, T.J., et al., Ultramicroscopy 151 (2015) 160167.CrossRefGoogle Scholar
[4] Yang, H., et al., Ultramicroscopy 151 (2015) 232239.CrossRefGoogle Scholar
[5] The authors acknowledge funding from the EPSRC through grant number EP/M010708/1.Google Scholar
You have Access

Save article to Kindle

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

The Use of Electron Ptychography to Implement Efficient Phase Imaging in STEM
Available formats
×

Save article to Dropbox

To save this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your Dropbox account. Find out more about saving content to Dropbox.

The Use of Electron Ptychography to Implement Efficient Phase Imaging in STEM
Available formats
×

Save article to Google Drive

To save this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your Google Drive account. Find out more about saving content to Google Drive.

The Use of Electron Ptychography to Implement Efficient Phase Imaging in STEM
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *