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Utilization of Atomic Force Microscopy, Confocal Microscopy, and Electron Microscopy to Evaluate Biomass Pretreatment

Published online by Cambridge University Press:  03 August 2008

B Simmons ,
D Dibble ,
S Singh ,
M Auer ,
D Jorgens  and
J-L Faulon
B Simmons
Affiliation:
Sandia National Laboratories
D Dibble
Affiliation:
Sandia National Laboratories
S Singh
Affiliation:
Sandia National Laboratories
M Auer
Affiliation:
Lawrence Berkeley National Laboratory
D Jorgens
Affiliation:
Lawrence Berkeley National Laboratory
J-L Faulon
Affiliation:
Sandia National Laboratories
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1492 - 1493
Copyright
© 2008 Microscopy Society of America

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