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Valence-loss EELS Spectroscopy of Refractory Plasmonic Nanomaterials

Published online by Cambridge University Press:  23 September 2015

Andrew A. Herzing ,
Urcan Guler ,
Xiuli Zhou  and
Theodore B. Norris
Andrew A. Herzing
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD USA.
Urcan Guler
Affiliation:
School of Electrical & Computer Engineering, Purdue University, West Lafayette, IN USA.
Xiuli Zhou
Affiliation:
Center for Ultrafast Optical Science, University of Michigan, Ann Arbor, MI USA.
Theodore B. Norris
Affiliation:
Center for Ultrafast Optical Science, University of Michigan, Ann Arbor, MI USA.

Abstract

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Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1901 - 1902
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Guler, U., et al, Appl. Phys. B 107 (2012) 285.CrossRefGoogle Scholar
[2] Guler, U., et al, Nano Letters 13 (2013) 6078.CrossRefGoogle Scholar
[3] Naik, G. V., et al, Opt. Mater. Express 2 (2012) 478.Google Scholar
[4] Ahn, C. C. & Krrvanek, O. L., "EELS Atlas," Gatan, 1983.Google Scholar