Hostname: page-component-7c8c6479df-24hb2 Total loading time: 0 Render date: 2024-03-29T04:40:59.705Z Has data issue: false hasContentIssue false

Very Large Area EDS Spectral Images: Impact of Latest Silicon Drift Detector Technology

Published online by Cambridge University Press:  01 August 2018

Jon J. McCarthy
Affiliation:
University of Wisconsin (Emeritus), Madison WI
John F. Konopka
Affiliation:
Thermo Fisher Scientific, Madison WI

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Fiori, C. E. Swyt, C. R. Microbeam Analysis 1992) p. 89.Google Scholar
[2] Gatti, E. Rehak, P. Nucl. Instrum. Methods A 42 1984) p. 12.Google Scholar
[3] McCarthy, J. J., Friel, J. Camus, P. Micros. Microanal 15(6 p. 484.Google Scholar
[4] Seddio, S. M. Carpenter, P. K. Micros. Microanal 2017) p. 1066.Google Scholar