Microscopy and Microanalysis: Volume 12 - Issue S02

Refine listing

Access:

Only show content I have access to (775)

Publication date:

Over 3 years (888)

Topic: Show more

Microscopy in Nanoscience and Nanotechnology (142)

FIB and FIB/SEM: Applications and techniques for Physical and Biological Sciences (54)

Electron Energy Loss Spectroscopy for the 21st Century (43)

Quantitative X-ray Microanalysis: A Symposium Honoring Art Chodos (38)

Cell Biology and Microscopy: A symposium dedicated to the memory of Hans Ris (35)

Tomography in Biological and Materials Sciences (35)

In Situ and other Advanced Microscopy and Microanalysis of Catalytic Materials: Nanoparticles and Porous Solids for Catalysis, Energy and Environment (33)

Applications in Materials Science and Engineering (32)

Microscopic Molecular Machines (29)

Chemical Imaging in Microanalysis: 50th Anniversary of X-ray Mapping (27)

Advances in STEM Techniques for Materials Characterization (25)

Pathology (23)

Microscopy and Microanalysis of Magnetic Materials (21)

Visualizing and Measuring Mechanical Behavior at Small Length Scales (20)

50th Anniversary of Observation of Dislocations (19)

Atom Probe Field Ion Microscopy (17)

Present and future limits of variable pressure and environmental SEM: Enabling nanoscale metrology, improved x-ray microanalysis and the understanding of novel contrasts in images of modern and novel materials (17)

Advances in Microscopy of Photosynthetic Organisms: An Integrative Understanding of Cell Structure and Function (16)

Approaching the 1-Å barrier in the CTEM (16)

Cathodoluminescence in the Scanning Electron Microscope (16)

Cryo-Preparation, Cryo-Sectioning, and Cryo-Approaches Using TEM, SEM, and FIB/SEM (16)

Microbes and Materials: Surveillance of the Unknown with Emphasis on Emerging Diseases and Terrorist Events (16)

Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Sciences (16)

Digital Imaging and Measurements (15)

Surface Microscopy and Microanalysis in Materials and Biological Systems (15)

Advances in Low Voltage Microscopy and Microanalysis (13)

General Metallographic Techniques & Applications (12)

Microscopy, Imaging and Training in the Digital Age (12)

TEM Automation (11)

High Resolution Labeling (10)

Multi-length Scale Characterization of Materials from Nanometer to Millimeter (10)

Failure Analysis & Prevention (8)

Optical Instrumentation (8)

Special Topics: Forensic Science – Solving the Whodunits with Microanalysis (8)

Ultrafast Electron Microscopy (8)

Metallographic Preparation & Analysis of Polymer Materials (7)

Analytical Limits in the Analysis of Nanotechnology (6)

Biomaterials (5)

Contamination Control in Electron and Ion Microscopy (5)

Electron Holography (5)

Main Platform Session: Optical Methods (5)

Semiconductors (4)

Advances in Instrumentation and Techniques (3)

Instrumentation Performance and Design (2)

Cryo-electron tomography: a powerful analytical tool to study cells and organelles at molecular resolution (1)

From fundamentals to the cutting edge: CCD technology for Digital Image Capture on Transmission Electron Microscopes. (1)

How to convert 2D serial sectioning images into a 3D dataset (1)

How to use the Dual Beam FIB-SEM to Characterize Microstructure in 3-D (1)

IMOD - A tool for 3-D reconstruction by TEM tomography (1)

IMS Henry Clifton Sorby Award and Lecture (1)

Microwave Processing in a Modern Microscopy Facility (1)

Recent Advances in Atom Probe Tomography and Applications to Understanding Nanomaterials (1)

Scanning Electron Microscopy (1)

Serial sectioning in the micron-plus range, and modern techniques for automation (1)

Classifications

Actions for selected content:

Select all | Deselect all

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Search Title: required Please provide a title, maximum of 40 characters.

Cancel

< Back to all issues

Volume 12 - Issue S02 - August 2006

Contents

Page 3 of 45

First
« Prev
1
2
3
4
5
6
7
Next »
Last

Multi-length Scale Characterization of Materials from Nanometer to Millimeter

Research Article

Variogram Characterization of the Length Scales of Topographic Patterns
NO Fuentes, EA Favret
Published online by Cambridge University Press:

31 July 2006, pp. 82-83
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

TEM Automation

Research Article

Advantages and Objectives of High-throughput Data Collection in Single-particle Cryo-EM
RM Glaeser, J Lee, D Typke
Published online by Cambridge University Press:

31 July 2006, pp. 84-85
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Automating the Collection of Ultrathin Serial Sections for Large Volume TEM Reconstructions
KJ Hayworth, N Kasthuri, R Schalek, JW Lichtman
Published online by Cambridge University Press:

31 July 2006, pp. 86-87
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Automated Acquisition of Tomographic and Random Conical Tilt Series and Real-time Reconstruction Using UCSF Tomography
SQ Zheng, MB Braunfeld, B Keszthelyi, E Branlund, JM Kollman, JW Sedat, DA Agard
Published online by Cambridge University Press:

31 July 2006, pp. 88-89
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Serial sectioning in the micron-plus range, and modern techniques for automation

Research Article

Serial Sectioning in the Micron-plus Range and Modern Techniques for Automation
JE Spowart
Published online by Cambridge University Press:

31 July 2006, pp. 90-91
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Cryo-electron tomography: a powerful analytical tool to study cells and organelles at molecular resolution

Research Article

Cryo-electron Tomography: A Powerful Analytical Tool for the Study of Cells and Organelles at Molecular Resolution
D Nicastro
Published online by Cambridge University Press:

31 July 2006, pp. 92-93
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Cryo-Preparation, Cryo-Sectioning, and Cryo-Approaches Using TEM, SEM, and FIB/SEM

Research Article

High Pressure Freezing: The Good, the Bad and the Ugly
K McDonald
Published online by Cambridge University Press:

31 July 2006, pp. 94-95
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Nuclear Structures in a High Resolution Cryo-SEM
P Walther, V Cordes
Published online by Cambridge University Press:

31 July 2006, pp. 96-97
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Focused Ion Beam (FIB) Preparation Methods for 3-D Biological Cryo-TEM
M Marko, C-E Hsieh, R Shalek, C Ting, C Mannella, J Frank
Published online by Cambridge University Press:

31 July 2006, pp. 98-99
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

High Pressure Freezing of Brain Tissue Slices
D Studer, S Zhao, W Graber, P Eggli, M Frotscher
Published online by Cambridge University Press:

31 July 2006, pp. 100-101
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Electron Energy Loss Spectroscopy for the 21st Century

Research Article

Limitations of Electron Energy-Loss Spectroscopy
R Egerton
Published online by Cambridge University Press:

31 July 2006, pp. 102-103
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Detection Limits for EELS Analysis of Biological Materials
RD Leapman
Published online by Cambridge University Press:

31 July 2006, pp. 104-105
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Improvement of TEM-EELS and Its Application for Materials in Semiconductor Devices
K Kimoto, K Ishizuka, Y Matsui
Published online by Cambridge University Press:

31 July 2006, pp. 106-107
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Perfection in Theoretical Modeling of Electron Energy Loss Spectra: Is it attainable?
P Rez
Published online by Cambridge University Press:

31 July 2006, pp. 108-109
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Response of Inhomogeneous Media to Valence Excitation by Fast Electrons
A Howie, A Rivacoba, J Garcia de Abajo
Published online by Cambridge University Press:

31 July 2006, pp. 110-111
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Atomic-Scale Studies of Complex Oxide Interfaces Using Aberration-Corrected Z-contrast Imaging and EELS
RF Klie, MA Schofield, M Varela, SJ Pennycook, A Bleloch, Y Zhu
Published online by Cambridge University Press:

31 July 2006, pp. 112-113
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Applications of High-Resolution EELS Near-Edge Structures in Complex Oxides
G Radtke, C Maunders, S Lazar, AD Lozano-Gorrin, JE Greedan, GA Botton
Published online by Cambridge University Press:

31 July 2006, pp. 114-115
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Surface Microscopy and Microanalysis in Materials and Biological Systems

Research Article

Modern Auger Electron Spectroscopy for Chemical Surface Analysis
D Paul, D Watson, J Moulder, S Bryan, S Alnabulsi
Published online by Cambridge University Press:

31 July 2006, pp. 116-117
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Enhancements in X-ray Photoelectron Spectroscopy for Improved Materials Characterization
D Surman
Published online by Cambridge University Press:

31 July 2006, pp. 118-119
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Time-of-Flight Secondary Ion Mass Spectrometry - A Chemical Microscope
A Schnieders
Published online by Cambridge University Press:

31 July 2006, pp. 120-121
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 3 of 45

First
« Prev
1
2
3
4
5
6
7
Next »
Last