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Ultra-Thin AFM Enables Integration with Light Microscope

  • Andy Erickson (a1) and Tim Ballinger (a1)
Abstract:

Atomic force microscopy (AFM) is used in a wide range of applications for imaging sub-nanometer resolution topography, as well as for analysis of physical characteristics (such as surface stiffness and electromagnetic properties). While surface imaging and characterization on the nanoscale is of great value and is widely used across all fields of science, correlation with other types of microscopy can greatly enhance the value of those measurements. Here, we discuss a new approach that uses a small, ultra-thin AFM, which allows it to be integrated with standard light microscopes. The authors believe the design will allow for a new paradigm in microscopy, by enabling all the advantages of AFM to be combined with the advanced imaging capabilities of research-grade light microscopes.

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References
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[1] Heintzmann, R and Ficz, G, Brief Funct Genomics 5(4) (2006) 289301.
[2] Binnig, G et al., Phys Rev Lett 56(9) 1(986) 930933.
[3] Butt, H-J et al., Surf Sci Rep 59 (2005) 1152.
[4] Erickson, et al., Scanning probe microscope head design, US Patent No. 9,366,695 B2, June 14, 2016.
[5] Geisse, NA; Materials Today 12(7–8) (2009) 4045.
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Microscopy Today
  • ISSN: 1551-9295
  • EISSN: 2150-3583
  • URL: /core/journals/microscopy-today
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