In the mammalian embryo, the first axis to appear is at the time of the fifth cell division when the inner cell mass (ICM) becomes visible. The localization of the ICM on one side of a cavity formed within the cluster of dividing cells marks the embryonic-abembryonic (E-Ab) axis. This name derives from the fact the most of the embryo will develop from the ICM, whereas other tissues (the placenta, etc.) will develop from the other cells. There has been a long-standing controversy as to what determines the mammalian E-Ab axis; is the information inherently in the zygote, or is it determined after several cell divisions? In an elegant series of studies whereby dividing cells were labeled using new molecular genetic tools and then carefully followed during development, Yoko Kurotaki, Kohei Hatta, Kazuki Nakao, Yo-ichi Nabeshima, and Toshihiko Fujimori have provided an answer in a mouse model.

Variable pressure scanning electron microscopy (VPSEM) coupled with other non-destructive analytical methods, such as energy dispersive (EDS) and Raman spectroscopy (RS) offers new capabilities for non-invasive imaging and chemical characterization of archaeological materials. This article underlines the application of VPSEM-EDS-RS on bioarchaeological specimens of pre-Columbian mummies from the Tarapacá Valley in northern Chile. The aim of the scientific investigations is to identify nonanatomical features and to provide qualitative and quantitative information at molecular levels, complementing the morphological record from studies in physical anthropology, in an effort to understand mortuary practices in the Tarapacá Valley and the effects of the burial environment in the preservation of mummified human remains.

The need for more precise image information of samples coming from fields such as materials analysis, semiconductor processing, and life sciences have pushed the boundaries of charged particle microscopy. A key limitation for the microscope maker in rising to these challenges lies in the relative technical maturity of source technology. Very few changes in sources have occurred in the last generations of tools available to the microscopist, while extensive efforts have been put into reducing aberrations that blur the probe—with their concomitant complexity and cost. Such efforts, representing incremental extensions of these technologies, cannot on their own address many of the emerging needs in nanotechnology. In addition, there are many challenges in the imaging of materials such as polymers and biological specimens that cannot be solved through resolution improvements but rather require different beam sample interaction dynamics. The helium ion microscope (HIM) is a breakthrough technology suited to such challenges.

Sample throughput is a significant issue in the microscopy lab. It is possible to improve the efficiency of analysis by changing the way we operate the microscope or upgrading the analytical system. One method to increase the efficiency of the analyst is to automate as many procedures as possible, including acquisitions. However, the most effective way to increase efficiency is to reduce the time that the analyst spends acquiring data. This is fine, but statistical confidence must not be reduced by the use of shorter acquisition times and the quality of the data or shape of the peaks must not be compromised as well (Figure 1, Table 1). To maintain the same level of statistical confidence of a longer analysis, an increase of the x-ray detection rate is needed.

Microfluidics, the study of fluid flow through structures with micrometer scale dimensions, is an increasingly important discipline within a number of commercial and industrial applications. One focus of active microfluidic research at the Stanford University Microscale Heat Transfer Laboratories (MHTL) is mass and heat transport in two-phase flows, which has applications in the cooling of integrated circuits and the management of water created in PEM fuel cells. At its core, two-phase microfluidics is the study of interactions between moving liquids and/or gases and/or solids (though not necessarily stationary) structures. Advanced confocal microscopy, with its ability to visualize and measure both flow and structure on a single instrumental platform, will certainly play a key role in the continuing development of microfluidic devices.

Magnetic recording media based on patterned shapes are promising for applications in high density data storage. Optimizing the design of the patterned arrays requires characterization of the particle shapes and their relative locations, and the magnetostatic interactions between particles. To achieve this, one must determine the three dimensional (3D) magnetic induction in and around the nano magnets. We propose a method based on Vector Field Electron Tomography coupled with phase reconstructed Lorentz Microscopy to determine the 3D magnetic induction. This method can be broken down into two steps 1) Determination of the magnetic phase shift of the electron wave using phase reconstructed Lorentz microscopy and 2) Reconstruction (in 3D) of the magnetic induction in and around the magnetic particle using Vector Field Electron Tomography (VFET). First, we will discuss the theoretical development of VFET and then the importance of spherical aberration (Cs) correctors for Lorentz microscopy.

We describe here a project to illustrate the diversity and abundance of marine bacteriophages undertaken by two high school students participating in The Scripps Research Institute's High School Student Research Education Program. The students were interns in the Automated Molecular Imaging group over the summer of 2007, during which time they acquired high magnification transmission electron microscopy images of bacteriophage filtered from samples collected from nearby marine waters. The basic protocols for sample collection, grid preparation, and electron microscopy imaging are described in this manuscript along with some of the images of the bacteriophages.

This article discusses AFM-based localized thermal analysis of crosslinked polymer coatings based on a recent breakthrough in nanoscale thermal probe technology. Examples include the monitoring of the softening point of automotive clearcoat systems, as a function of cure time and cure temperature and characterization of degradation and embrittlement of weathered acrylic-polyurethane coatings. Comparison of nano thermal analysis with bulk DSC and MDSC is made and its inherent advantages over DSC in analyzing surfaces is demonstrated.

Semiconductor manufacturers are increasingly turning to Transmission Electron Microscopes (TEMs) to monitor product yield and process control, analyze defects, and investigate interface layer morphology. To prepare TEM specimens, Focused Ion Beam (FIB) technology is an invaluable tool, yielding a standard milled TEM lamella approximately 15 μm wide, 5 μm deep and ~100 nm thick. Several techniques have been developed to extract these tiny objects from a large wafer and view it in the TEM. These techniques, including ex-situ lift-out, H-bar, and in-situ lift-out, have different advantages and disadvantages, but all require painstaking preparation of one specimen at a time.

The subject of SEM saturation was discussed on the microscopy list server and off list I was aslied why filaments burn out on the side leg Instead of at the tip. I have degrees in electronics technology and in chemistry as well as being a microscopist. So I investigated this subject and performed some experiments to verify my results.

According to Ohm's Law, one would expect that the highest resistance would be at a sharply bent V’ and that is where the filament would be expected to burn out. However, observations of the phenomenon show this is not where the filament burns out.

This work involves the development and application of a database for the morphological, crystallographic, and chemical characterization of amphibole particles that occur as accessory minerals in the former vermiculite mine in Libby, Montana. The data in the database were collected using transmission electron microscopy (TEM) and field emission scanning electron microscopy (FESEM) techniques for particle-by-particle characterization of mixed mineral dust samples.

In the fall of 1999, public attention was focused on the small town of Libby due to health concerns over potential amphibole asbestos exposure that occurred in the now closed vermiculite mine. The vermiculite deposit, located in the Rainy Creek Igneous Complex, about seven miles northeast of Libby, was discovered in 1913 and commercial production of vermiculite began in 1923.

A Duke University Talent Identification Program (TIP) nanotechnology course curriculum integrated a Hitachi TM-1000 table top scanning electron microscope (SEM) into the classroom to excite and educate gifted and talented high school students interested in this emerging field of research. Students learned about synthesis, characterization and applications of nanotechnologies to encourage them to begin thinking about why and how properties of matter change at the nanoscale. The syllabus was created to introduce fundamental concepts like introductory quantum mechanics, atomic bonding, allotropes of carbon and applications including nanomedicine, nanoelectronics, nano-textiles, bionanotechnology and nanometals. The classroom environment allowed students to take intellectual risks and the course content was presented through a variety of methods to utilize the Kolb learning model and encompass intellectual, personal, social and practical learning methods. The teaching approaches employed traditional principle based lectures, but also included guest speakers, experiential learning activities and both project or problem based learning laboratories.

Is there's a child in your life? Are you thinking about giving a microscope this holiday season? DO IT! But please think carefully about what you buy. You’re reading Microscopy Today, so you use some sort of microscope professionally; you may be tempted to give the youngster a lab-quality hand-me-down. DON’T! The complexities that you take for granted will only intimidate them. The youngest child will enjoy a magnifiying glass. I still remember the pocket-flashlight-style microscope that I had when I was young; I took it everywhere. After that, the best “first” microscope is a monocular dissecting scope; you can consider a very basic compound microscope later, in the middle school years.