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    This article has been cited by the following publications. This list is generated based on data provided by CrossRef.

    Lee, Wonyoung and Prinz, Fritz B. 2014. Localized charge transfer reactions near the Pt-YSZ interfaces using Kelvin probe microscopy. International Journal of Precision Engineering and Manufacturing-Green Technology, Vol. 1, Issue. 3, p. 201.


    Cox, Phillip A. Waldow, Dean A. Dupper, Torin J. Jesse, Stephen and Ginger, David S. 2013. Mapping Nanoscale Variations in Photochemical Damage of Polymer/Fullerene Solar Cells with Dissipation Imaging. ACS Nano, Vol. 7, Issue. 11, p. 10405.


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Nanoscale impedance and complex properties in energy-related systems

  • Wonyoung Lee (a1), Fritz B. Prinz (a2), Xi Chen (a3), S. Nonnenmann (a4), Dawn A. Bonnell (a5) and Ryan P. O’Hayre (a6)
  • DOI: http://dx.doi.org/10.1557/mrs.2012.145
  • Published online: 01 July 2012
Abstract
Abstract

Atomic force microscopy (AFM)-based impedance spectroscopy provides localized impedance information of materials and interfaces at the nanoscale by utilizing the conductive AFM tip as a moving electrode to detect current response as a function of time and frequency under controlled environments. This capability enables AFM-based nanoscale impedance measurements to play a unique role in enhancing our understanding of many electronic and electrochemical devices. This article introduces the central concepts of AFM-based impedance measurement and reviews recent examples applying this technique to a variety of functional materials systems, in particular focusing on fuel cells, lithium-ion batteries, photoactive biomembranes, as well as other application examples.

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