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Simultaneously grown single wall carbon nanotube channel and electrodes in a thin film transistor

Published online by Cambridge University Press:  22 June 2012

Jinsup Lee ,
Bo-Hyun Kim ,
Seong Jun Kang ,
Kar Tham Hyun ,
Seok-Hee Lee  and
Seokwoo Jeon
Jinsup Lee
Affiliation:
Department of Material Science and Engineering, NanoCentury KI, KAIST, 291 Daehak-ro, Yuseong-gu, Daejeon 305-701, Republic of Korea
Bo-Hyun Kim
Affiliation:
Department of Material Science and Engineering, NanoCentury KI, KAIST, 291 Daehak-ro, Yuseong-gu, Daejeon 305-701, Republic of Korea
Seong Jun Kang
Affiliation:
Department of Advanced Materials Engineering for Information and Electronics, Kyung Hee University, Seocheon-dong, Giheung-gu, Yongin-si, Gyeonggi-do 446-701, Republic of Korea
Kar Tham Hyun
Affiliation:
Department of Material Science and Engineering, NanoCentury KI, KAIST, 291 Daehak-ro, Yuseong-gu, Daejeon 305-701, Republic of Korea
Seok-Hee Lee
Affiliation:
Department of Electrical Engineering, KAIST, 291 Daehak-ro, Yuseong-gu, Daejeon 305-701, Republic of Korea
Seokwoo Jeon*
Affiliation:
Department of Material Science and Engineering, NanoCentury KI, KAIST, 291 Daehak-ro, Yuseong-gu, Daejeon 305-701, Republic of korea
*
Address all correspondence to Seokwoo Jeon atjeon39@kaist.ac.kr
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Abstract

By chemical vapor deposition, aligned single wall carbon nanotubes (SWNTs) and a network of SWNTs are simultaneously grown as the channel and the source–drain electrodes of thin film transistors (TFTs). The increase of aligned SWNTs increases the channel conductance without changing the contact resistance. However, the increase of network-type SWNTs from 19 to 32.5 (SWNTs/μm) decreases the contact resistance fivefold. The contact resistance of all-SWNT TFT is three times lower compared with that of an SWNT TFT using metal electrodes. The all-SWNT TFTs transferred on polyethylene terephthalate (PET) show a transparency of >80% in the visible range of wavelengths.

Type
Research Letters
Information
MRS Communications , Volume 2 , Issue 3 , September 2012 , pp. 79 - 83
Copyright
Copyright © Materials Research Society 2012

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