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Band structure investigation of chalcopyrite CuInSe2(001) by angle-resolved photoelectron spectroscopy

Published online by Cambridge University Press:  01 February 2011

Ralf Hunger  and
Christian Pettenkofer
Ralf Hunger
Affiliation:
Fachgebiet Oberflächenforschung, Institut für Materialwissenschaft, TU Darmstadt, Petersenstr. 23, 64287 Darmstadt, Germany
Christian Pettenkofer
Affiliation:
Abteilung SE 6, Bereich Solarenergieforschung, Hahn-Meitner-Insitut Berlin GmbH, Glienicker Str. 100, 14109 Berlin
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Abstract

Clean and ordered chalcopyrite CuInSe2 surfaces are a precondition for the study of the electronic structure by angle-resolved photoelectron spectroscopy. The preparation of welldefined CuInSe2(001) surfaces by the combination of molecular beam epitaxy and a selenium capping and decapping process is described. The surface structure of CuInSe2 epilayers with different bulk composition is compared and analysed by low-energy electron diffraction.

Employing near-stoichiometric surfaces, the valence electronic structure of CuInSe2 was investigated by angle-resolved photoelectron spectroscopy at the synchrotron source BESSY 2. This is the first study of the valence band structure of a copper chalcopyrite semiconductor material by photoelectron spectroscopy. The valence band dispersion along τT, i.e. the [001] direction, was investigated by a variation of the excitation energy from 10 to 35 eV under normal emission, and the band dispersion along τT, i.e. the [110] direction, was analysed by angular scans with hv = 13 eV.

The valence bands derived from antibonding and bonding Se4p-Cu3d hybrid orbitals, nonbonding Cu3d states and In-Se hybrid states are clearly indentified. The strongest dispersion is found for the topmost valence band with a bandwidth of ∼0.7 eV from τ to T. From τ to N, the observed dispersion was 0.5 eV. The experimental valence bands are discussed in relation to calculated band structures in the literature.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 865: Symposium F – Thin-Film Compound Semiconductor Photovoltaics , 2005 , F2.2
Copyright
Copyright © Materials Research Society 2005

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References

[1] Rau, U. and Schock, W., Appl. Phys. A 69 (1999) 131.Google Scholar
[2] Jaffe, E.J. and Zunger, A., Phys. Rev. B 28 (1983) 5822.Google Scholar
[3] Belhadj, M., Tadjer, A., Abbar, B., Bousahla, Z., Bouhafs, B. and Aourag, H., phys. stat. sol. (b) 241 (2004) 2516.Google Scholar
[4] Zhang, S.B., Wei, S.H., Zunger, A. and Katayama-Yoshida, H., Phys. Rev. B 57 (1998) 9642.Google Scholar
[5] Hüfner, S., Photoelectron Spectroscopy. (Springer, Berlin, 1994). F2.2.11 Google Scholar
[6] Scheer, R., Research Trends in Vacuum Science and Technology 1 (1997) 77.Google Scholar
[7] Hunger, R., Schulmeyer, T., Klein, A., Jaegermann, W., Sakurai, K., Yamada, A., Fons, P., Matsubara, K. and Niki, S., Surf. Sci. 557 (2004) 263.Google Scholar
[8] Niki, S., Makita, Y., Yamada, A., Hellman, O., Fons, P.J., Obara, A., Okada, Y., Shioda, R., Oyanagi, H., Kurafuji, T., Chichibu, S., Nakanishi, H., J. Cryst. Growth 150 (1995) 1201.Google Scholar
[9] Yamada, A., Fons, P., Matsubara, K., Iwata, K., Sakurai, K. and Niki, S., Thin Solid Films 431-432 (2003) 277.Google Scholar
[10] Schulmeyer, T., Kniese, R., Hunger, R., Jaegermann, W., Powalla, M. and Klein, A., Thin Solid Films 451-452 (2004) 420.Google Scholar
[11] Deniozou, T., Esser, N., Schulmeyer, T. and Hunger, R., submitted (2005).Google Scholar
[12] Hunger, R., Pettenkofer, C. and Scheer, R., Surf. Sci. 477 (2001) 76.Google Scholar
[13] Herberholz, R., Rau, U., Schock, H.W., Haalboom, T., Gödecke, T., Ernst, F., Beilharz, C., Benz, K.W. and Cahen, D., Eur. Phys. J. AP 6 (1999) 131.Google Scholar
[14] Löher, T., Klein, A., Pettenkofer, C. and Jaegermann, W., J. Appl. Phys. 81 (1997) 7806.Google Scholar
[15] Schmid, D., Ruckh, M. and Schock, H.W., Appl. Surf. Sci. 103 (1996) 409.Google Scholar
[16] Deniozou, T., Esser, N., Siebentritt, S., Vogt, P. and Hunger, R., Thin Solid Films 480-481 (2005) 382.Google Scholar
[17] Deniozou, T., Esser, N. and Siebentritt, S., Surf. Sci. 579 (2005) 100.Google Scholar
[18] Mayer, T., Lebedev, M.V., Hunger, R. and Jaegermann, W., Appl. Surf. Sci. (2005) in press.Google Scholar
[19] Takarabe, K., Kawai, K., Minomura, S., Irie, T. and Taniguchi, M., J. Appl. Phys. 71 (1992) 441.Google Scholar