Hostname: page-component-8448b6f56d-c4f8m Total loading time: 0 Render date: 2024-04-20T10:40:31.774Z Has data issue: false hasContentIssue false

Characterization of BaTiO3 Thin Films Deposited by Pulsed-Laser Ablation

Published online by Cambridge University Press:  26 February 2011

Christopher Scarfone
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853.
M. Grant Norton
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853.
C. Barry Carter
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853.
Jian Li
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853.
James W. Mayer
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853.
Get access

Abstract

Thin films of barium titanate (BaTiOs) have been deposited by pulsed-laser ablation onto (001)-oriented MgO substrates. The films were epitactic as evidenced by both x-ray diffraction and ion-channeling techniques. The film surface appeared smooth and contained a low density of particulates. This latter feature is believed to be due to the formation of target pellets having a very high density.

Type
Research Article
Copyright
Copyright © Materials Research Society 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Moulson, A.J. and Herbert, J.M., Electroceramies, (Chapman and Hall, London 1990)Google Scholar
2. Cheung, J.T. and Sankur, H., CRC Critical Reviews in Solid State and Materials Sciences, 15, 63 (1988)Google Scholar
3. Koren, G., Baseman, R.J., Gupta, A., Lutwyche, M.I. and Laibowitz, R.B., Appl. Phys. Lett. 56, 2144 (1990)Google Scholar
4. Norton, M.G. and Carter, C.B., J. Mater. Res. to appear in 5, (1990)Google Scholar
5. Russek, S.E., Moeckly, B.H., Buhrman, R.A., McWhirter, J.T., Sievers, A.J., Norton, M.G., Tietz, L.A. and Carter, C.B., in High Temperature Superconductors: Fundamental Properties and Novel Materials Processing, edited by Narayan, J. et. al. (Mater. Res. Soc. Symp. Proc. 169, Pittsburgh, PA, 1990)Google Scholar
6. Davis, G.M. and Gower, M.C., Appl. Phys. Lett. 55, 112 (1989)Google Scholar
7. Blanpain, B., Revesz, P., Doolittle, L.R., Purser, K.H. and Mayer, J.W., Nucl. Inst. Meth. B34, 459 (1988)Google Scholar
8. Li, Q., Meyer, O., Xi, X.X., Geerk, J. and Linker, G., Appl. Phys. Lett. 55, 310 (1989)Google Scholar