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A Comparative Study of MOCVD Produced ZnO Films Doped with N, As, P and Sb

Published online by Cambridge University Press:  01 February 2011

Gary S. Tompa
Affiliation:
GSTompa@aol.com, Structured Materials Industries, Inc., R&D, 201 Circle Drive North, Unit 102/103, Piscataway, NJ, 08854, United States, 732-302-9274, 732-302-9275
S. Sun
Affiliation:
shangzus@patmedia.com, Structured Materials Industries, Inc., 201 Circle Drive N., Unit 102/103, Piscataway, NJ, 08854, United States
C. E. Rice
Affiliation:
cerice@structuredmaterials.com, Structured Materials Industries, Inc., 201 Circle Drive N., Unit 102/103, Piscataway, NJ, 08854, United States
L. G. Provost
Affiliation:
gprovost@structuredmaterials.com, Structured Materials Industries, Inc., 201 Circle Drive N., Unit 102/103, Piscataway, NJ, 08854, United States
D. Mentel
Affiliation:
dmentel@structuredmaterials.com, Structured Materials Industries, Inc., 201 Circle Drive N., Unit 102/103, Piscataway, NJ, 08854, United States
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Abstract

ZnO thin films are of interest for an array of applications; including: light emitters, photovoltaics, sensors and transparent contacts among others. Of particular interest is the potential to produce p-type layers from which p-n junction devices could be routinely produced. While it is fairly routine for MOCVD to produce n-type films with doping concentrations in the 10E20 cm-3 range and resistivities below 10E-3 ohm-cm; it is very difficult to produce measurable p-type ZnO. We report on our efforts with doping films p-type using N gas sources and metalorganic sources of P, As, and Sb. Films showing acceptor bands by photoluminescence have been demonstrated; however reliable electrical measurements remain difficult. Specific problems include achieving low resistance ohmic contacts, accounting for the photo-responsiveness of ZnO films and sensitivity limits in Hall measurements of low-doped and compensated materials. The presentation will review deposition parameters, produced and processed films and material characteristics.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

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