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Electrical Characterization of Polyaniline-ZnO nano-composite Langmuir-Blodgett thin films by Conductive Atomic Force Microscopy

Published online by Cambridge University Press:  29 August 2014

Gurpreet Kaur Bhullar
Affiliation:
Materials Research Laboratory, School of Physics and Materials Science, Thapar University, Patiala-147004, India
Ramneek Kaur
Affiliation:
Materials Research Laboratory, School of Physics and Materials Science, Thapar University, Patiala-147004, India
K. K. Raina
Affiliation:
Materials Research Laboratory, School of Physics and Materials Science, Thapar University, Patiala-147004, India
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Abstract

Polyaniline–Zinc oxide nano-composite material was prepared by chemical polymerization of aniline with ZnO nano-particles doping. Surface Pressure-Area (π-A) isotherms of Polyaniline (PANi) and Polyaniline–Zinc oxide nano-composite shows phase transformations of monolayer during compression process. Multiple isotherms indicate that the monolayer of the composite material can retain its configuration during compression-expansion cycles. The structural, topographical and electrical properties of these deposited Langmuir Blodgett films were studied and characterized by UV-Visible spectroscopy (UV), Atomic force microscopy (AFM), Conductive Atomic force microscopy (C-AFM) respectively. For detailed investigations of the LB film properties, Conductive AFM is used to measure the I-V relationship of a surface of Langmuir Blodgett (LB) films of Polyaniline and Polyaniline–Zinc oxide nano-composite. The contact size of the AFM cantilever tip can be as small as a few nanometers, so, the local variation of the electrical property, which is unseen in the macroscopic level, can be observed by the I-V curve. A current ranging up to 3 nA and 20 nA have been observed in the case of PANi and PANi-ZnO nano-composite LB film, respectively. Conductive data images of the ITO substrate, PANi and PANi-ZnO nano-composite LB film on the ITO substrate obtained with an applied bias voltage of 4V showed that the distribution of current on the whole surface is almost uniform and very less inhomogeneities have been observed in the surface conductance of the PANi and PANi-ZnO nano-composite LB film.

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Articles
Copyright
Copyright © Materials Research Society 2014 

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References

REFERENCES

Sekine, N., Chou, C.H., Kwan, W. L. and Yang, Y., Organic Electronics 10, 1473 (2009).CrossRefGoogle Scholar
Yang, Y., Chen, H., Zhao, B. and Bao, X., J. Cryst. Growth 263, 447 (2004).CrossRefGoogle Scholar
Lee, Y.H., Kim, C.A., Jang, W.H., Choi, H.J. and Jhon, M.S., Polymer 42, 8277 (2001).CrossRefGoogle Scholar
Bossi, A., Piletsky, S. A., Piletska, E.V., Righetti, P.G. and Turner, A.P.F., Anal. Chem. 72, 4296 (2000).CrossRefGoogle Scholar
Matei, A., Cernica, I., Cadar, O., Roman, C. and Schiopu, V., Int. J. Mater. Form. 1, 767 (2008).CrossRefGoogle Scholar
Oliveira, O. N. Jr., Raposo, M., Dhanabalan, A., In Handbook of Surfaces and Interfaces of Materials, edited by Nalwa, H.S., Solid Thin Films and Layers, (Elsevier: Academic Press, (2001), Vol. 4, Chapter 1) p. 21 Google Scholar
Huo, L.H., Cao, L.X., Wang, D.M., Cui, H.N., Zeng, G.F. and Xi, S.Q., Thin Solid Films 350, 5 (1999).CrossRefGoogle Scholar
Dhanabalan, A., Riul, A. Jr., Mattoso, L. H. C. and Oliveira, O. N. Jr, Langmuir 13, 4882 (1997).CrossRefGoogle Scholar
Min, S., Wang, F. and Han, Y., J Mater Sci 42, 9966 (2007).CrossRefGoogle Scholar
Granholm, P., Paloheimo, J. and Stubb, H., Physica Scripta. T69, 146 (1997).CrossRefGoogle Scholar
Huo, L.H., Cao, L.X., Wang, D.M., Cui, H.N., Zeng, G.F. and Xi, S.Q., Thin Solid Films 350, 59 (1999).CrossRefGoogle Scholar
Kaur, R., Bhullar, G.K., Raina, K.K., Liq. Cryst. 39, 1375 (2012).CrossRefGoogle Scholar
Perween, M., Gupta, R., Rebary, B., Kulshresthab, V. and Srivastava, D. N., Phys. Chem. Chem. Phys. 15, 17758 (2013).CrossRefGoogle Scholar