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Electrochromic Properties of Polycrystalline Nb2O5 Thin Films with Mg2+ Ions

Published online by Cambridge University Press:  01 February 2011

Gargi Agarwal  and
G. B. Reddy
Gargi Agarwal
Affiliation:
gargiiitd@gmail.com, ., ., ., ., ., United States
G. B. Reddy
Affiliation:
gbreddy@physics.iitd.ernet.in, Indian Institute of Technology Delhi, Thin Film Laboratory, Department of Physics, New Delhi, N/A, 110016, India
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Abstract

Sol-gel derived Nb2O5 thin films crystallize to a stable hexagonal phase on annealing at 600°C in air. These films have been intercalated with Mg2+ ions for the first time and the structural and the optical changes on intercalation have been reported. Films were intercalated and deintercalated with Mg2+ ions in galvanostatic mode. Mg intercalated films show about 35% transmittance variations in the entire spectral range. The FTIR studies show the formation of Mg-O-Nb bonds along with the formation of Nb-OH and Mg-O bonds. Small quantities of water is adsorbed during intercalation resulting in the formation of Mg(OH)2. The coloration is completely reversible on deintercalation. Formation of MgNb2O6 phase is seen on intercalation with 1M concentration of the electrolyte, which is found to be 'x' dependent, where ‘x’ is the ratio of the intercalated ions to the Nb atoms. 0.1 M electrolyte does not show the formation of this phase.

Keywords

intercalationMgsol-gel
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 936: Symposium L – Materials for Next-Generation Display Systems , 2006 , 0936-L10-01
Copyright
Copyright © Materials Research Society 2006

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References

1 Orel, Boris, Maèek, Marjeta, Grdadolnik, JoΖe, Meden, Anton, J. Solid State Electrochem, 2, 221 (1998).Google Scholar
2 Yoshimura, Kazuki, Miki, Takeshi, Tanemura, Sakae, J. Electrochem. Soc., 144, 2983 (1997).Google Scholar
3 Sian, Tarsame S., Reddy, G.B., Solid State Ionics, 167 399 (2004).Google Scholar
4 Pereira-Ramos, J. P., Messina, R., Perichon, J., J. Electroanal. Chem., 218 241–249 (1987).Google Scholar
5 Agarwal, Gargi, Reddy, G.B., J. of Material Science: Materials in Electronics, 16, 21 (2005).Google Scholar
6 Agarwal, Gargi, Reddy, G.B., presented at 3rd International Conference on Materials for Advanced Technology, ICMAT 2005, Singapore, July 2005 (unpublished), communicated to Electrochim. Acta.Google Scholar
7 Schmitt, M., Aegerter, M.A., Electrochim. Acta, 46, 2105 (2001)Google Scholar
8 Svitelskiy, O., Toulouse, J., Yong, G., Phys. Rev. B, 68 104107–1 (2003).Google Scholar
9 Lu, Z., Schechter, A., Moshkovich, M., AQurbach, D., J. Electroanal. Chem., 466, 203 (1999).Google Scholar
10 Uekawa, N., Kudo, T., Mori, F., Wu, Yong Jun, Kakegawa, K., J. of Colloid and Interface Sci., 264 378 (2003).Google Scholar